Emerging nanotechnologies : test, defect tolerance, and reliability

Author(s)

• Tehranipoor, Mohammad H.

Bibliographic Information

Emerging nanotechnologies : test, defect tolerance, and reliability

Mohammad Tehranipoor, editor

（Frontiers in electronic testing, 37）

Springer, c2008

Note

Includes bibliographical references and index

Details

• NCID: BA88633446
• ISBN:
  • 9780387747460
• LCCN: 2007933699
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: New York
• Pages/Volumes: xii, 405 p.
• Size: 25 cm
• Classification:
  • LCC : T174.7
• Subject Headings:
  • LCSH : Nanotechnology
  • LCSH : Microtechnology
• Parent Bibliography ID:
  • BA19587827