Proceedings of the 16th Asian Test Symposium, 8-11 October 2007, Beijing, China

著者

• Asian Test Symposium
• IEEE Computer Society. Test Technology Technical Council

書誌事項

Proceedings of the 16th Asian Test Symposium, 8-11 October 2007, Beijing, China

sponsored by IEEE Computer Society Test Technology Technical Council (TTTC), Institute of Computing Technology, Chinese Academy of Sciences ; in cooperation with Technical Committee on Fault Tolerant Computing of CCF, National Natural Science Foundation of China (NSFC)

IEEE Computer Society, c2007

タイトル別名

ATS 2007

注記

"IEEE Computer Society Order Number P2890"--T.p. verso

Includes bibliographical references and index

詳細情報

• NII書誌ID(NCID): BA89317306
• ISBN:
  • 9780769528908
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Los Alamitos, Calif.
• ページ数/冊数: xxiv, 528 p.
• 大きさ: 28 cm