Proceedings of the 16th Asian Test Symposium, 8-11 October 2007, Beijing, China

Author(s)

• Asian Test Symposium
• IEEE Computer Society. Test Technology Technical Council

Bibliographic Information

Proceedings of the 16th Asian Test Symposium, 8-11 October 2007, Beijing, China

sponsored by IEEE Computer Society Test Technology Technical Council (TTTC), Institute of Computing Technology, Chinese Academy of Sciences ; in cooperation with Technical Committee on Fault Tolerant Computing of CCF, National Natural Science Foundation of China (NSFC)

IEEE Computer Society, c2007

Other Title

ATS 2007

Note

"IEEE Computer Society Order Number P2890"--T.p. verso

Includes bibliographical references and index

Details

• NCID: BA89317306
• ISBN:
  • 9780769528908
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Los Alamitos, Calif.
• Pages/Volumes: xxiv, 528 p.
• Size: 28 cm