2008 17th Asian Test Symposium, Hokkaido, Japan 24-27 November 2008

Author(s)

• Asian Test Symposium

Bibliographic Information

2008 17th Asian Test Symposium, Hokkaido, Japan 24-27 November 2008

IEEE, c2008

Other Title

Proceedings of the 17th Asian Test Symposium

ATS

Note

"IEEE Catalog Number CFP08067-PRT"-- cover

Includes bibliographical references and index

Details

• NCID: BA90540905
• ISBN:
  • 9781424440030
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Piscataway, N.J.
• Pages/Volumes: xxiv, 392 p.
• Size: 28 cm