2009 IEEE VLSI Test Symposium (VTS), Santa Cruz, California, USA, 03-07 May 2009

Author(s)

• IEEE VLSI Test Symposium

Bibliographic Information

2009 IEEE VLSI Test Symposium (VTS), Santa Cruz, California, USA, 03-07 May 2009

IEEE, c2009

Other Title

CFP09029-PRT

Note

"IEEE Catalog Number: CFP09029-PRT"

Details

• NCID: BA91448307
• ISBN:
  • 9781424437696
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Piscataway, N.J.
• Pages/Volumes: 308 p.
• Size: 28 cm