Cold field emission and the scanning transmission electron microscope
Author(s)
Bibliographic Information
Cold field emission and the scanning transmission electron microscope
（Advances in imaging and electron physics / edited by Peter W. Hawkes, v. 159）
Elsevier Academic Press, 2009
Available at / 15 libraries
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The Institute for Solid State Physics Library. The University of Tokyo.図書室
549:A4:1597210299769
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Note
Includes bibliographical references and index
Description and Table of Contents
Description
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. This particular volume presents several timely articles on the scanning transmission electron microscope.
Table of Contents
The beginnings and development of the scanning transmission electron microscope (STEM)
Albert V. Crewe
STEM in the life sciences
Andreas Engel
The AEI and Siemens STEM instruments
Peter Hawkes
STEM in Japan
Hiromi Inada
Early work on the STEM
Michael S. Isaacson
The Toulouse high-voltage STEM project
Bernard Jouffrey
Aberration-corrected STEM
Ondrej Krivanek
STEM in Cambridge
K.C.A. Smith
A review of the cold field electron cathode
Lyn Swanson and Greg Schwind
STEM in Oxford and at Vacuum Generators
Sebastian von Harrach
The Vacuum Generators STEM
Ian Wardell and Peter Bovey
Historical background of the STEM at Brookhaven National Laboratory
Joseph Wall
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