Advances in imaging and electron physics

著者

• Hawkes, P. W. (Peter William)
• Hÿtch, Martin

書誌事項

Advances in imaging and electron physics

edited by Peter W. Hawkes

Academic Press, 1995-

• v. 90
• v. 91
• v. 92
• v. 93
• v. 94
• v. 95
• v. 97
• v. 98
• v. 99
• v. 100, partial cumulative index
• v. 101
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• v. 104 : cumulative index
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タイトル別名

Advances in imaging and electron physics including proceedings CPO-10

注記

-v.89: Advances in electronics and electron physics

子書誌あり

v.128- published by Elsevier

Includes bibliographical references and index

v. 210-212: edited by Peter W. Hawkes and Martin Hÿtch

v. 212: including proceedings CPO-10

内容説明・目次

巻冊次

v. 90 ISBN 9780120147328

内容説明

A merger of "Advances in Electronics and Electron Physics" and "Advances in Optical and Electron Microscopy". This serial publication features articles on minimax algebra, electron diffraction theory and parallel image processing.

目次

• Minimax algebra and applications, R.A. Cunninghame-Green
• physical information and the derivation of electron physics, B.R. Frieden
• new developments of electron diffraction theory, L-M. Peng
• parallel image processing with image algebra on SIMD mesh-connected computers, H. Shi, G.X. Ritter and J.N. Wilson.

巻冊次

v. 91 ISBN 9780120147335

内容説明

Academic Press is pleased to announce the creation of ADVANCES IN IMAGING & ELECTRON PHYSICS. This serial publication results from the merger of two long running serials - ADVANCES IN ELECTRONICS & ELECTRON PHYSICS and ADVANCES IN OPTICAL & ELECTRON MICROSCOPY. ADVANCES IN IMAGING & ELECTRON PHYSICS will feature extended articles on minimax algebra, electron diffraction theory, and parallel image processing. Continuation order customers for either of the original ADVANCES will receive Volume 90, the first combined volume, at no charge.

目次

• Part 1: canonical aberration theory in electron optics up to ultrahigh-order approximation, J. Ximen
• some new developments on generalized information measures, I.J. Taneja. Part 2 50 years of electronics: the exploitation of semiconductors, B.L.H. Wilson
• the use and abuse of III-V compounds, C. Hilsum
• telecommunications - the last, and the next, 50 years, J. Bray
• mesoscopic devices where electrons behave like light, A.J. Holden
• the evolution of electrical displays, 1942-1992, D. Grover
• Gabor's pessimistic 1942 view of electron microscopy and how he stumbled on the Nobel Prize, T. Mulvey
• early techniques in radio astronomy, A. Hewish.

巻冊次

v. 92 ISBN 9780120147342

内容説明

This volume includes chapters discussing image enhancement and propagation, and field behaviour in highly anisotropic media. It is intended for researchers in optical science, electrical engineering, image processing and mechanical engineering.

目次

• Image enhancement, P. Zamperoni
• electromagnetic propagation and field behaviour in highly anisotropic media, C.M. Krowne.

巻冊次

v. 93 ISBN 9780120147359

内容説明

This volume features extended articles on minimax algebra, electron diffraction theory and parallel image processing.

巻冊次

v. 94 ISBN 9780120147366

内容説明

This work features articles on the physics of electron devices, particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

目次

• Group algebras in signal and image processing, D. Wenzel and D. Eberly
• mirror electron microscopy, R. Godehardt
• rough sets, J.W. Grzymala-Busse
• theoretical concepts of electron holography, F. Kahl and H. Rose
• quantum neural computing, S.C. Kak
• signal description - new approaches, new results, A.M. Zayezdny and I. Druckmann.

巻冊次

v. 95 ISBN 9780120147373

内容説明

Advances in Imaging and Electron Physics is the merger of two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical & Electron Microscopy. It features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computingmethods used in all these domains.

目次

L. Lambert and T. Mulvey, Ernst Ruska (1906 1988), Designer Extraordinaire of the Electron Microscope: A Memoir. V.T. Binh, N. Garcia, and S.T. Purcell, Electron Field Emission from Atom-Sources: Fabrication, Properties, and Applications of Nanotips. P.L. Combettes, The Convex Feasibility Problem in Image Recovery. C. Doran, A. Lasenby, S. Gull, S. Somaroo, and A. Challinor, Spacetime Algebra and Electron Physics. H.C. Shen and D. Srivastava,Texture Representation and Classification: The Feature Frequency Matrix Approach. Chapter References. Subject Index.

巻冊次

v. 97 ISBN 9780120147397

内容説明

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical & Electron Microscopy. It features extended articles onthe physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

目次

R. Navarro, A. Tabernero, and G. Cristobal, Image Representaton with Gabor Wavelets and Its Applications. L. Bedini, I. Gerace, E. Salerno, and A. Tonazzini, Models and Algorithms for Edge-Preserving Image Reconstruction. E.A.B. da Silva and D.G. Sampson, Successive Approximation Wavelet Vector Quantization for Image and Video Coding. R. Jagannathan and S.A. Khan, Quantum Theory of the Optics of Charged Particles. J. Ximen, Ultrahigh-Order Canonical Aberration Calculation and Integration Transformation in Rotationally Symmetric Magnetic and Electrostatic Lenses. Appendix. Chapter References. Subject Index.

巻冊次

v. 98 ISBN 9780120147403

内容説明

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

目次

D. Greenspan, Quantitative Particle Modeling. C.M. Krowne, Theory of the Recursive Dyadic Greens Function for Inhomogeneous Ferrite Canonically-Shaped Circulators. M. Mankos, M.R. Scheinfein, and J.M. Cowley,Electron Holography and Lorentz Microscopy of Magnetic Materials. Subject Index.

巻冊次

v. 99 ISBN 9780120147410

内容説明

Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

目次

P.T. Jackway, Morphological Scale-Spaces. C.L.F. Ma, M.J. Deen, and L.E. Tarof, Characterization and Modelling of SAGCM InP/InGaAs Avalanche. C.L.F. Ma, M.J. Deen, and L.E. Tarof, Photodiodes for MultigigabitOptical Fiber Communications. G. Matteucci, G.F. Missiroli, and G. Pozzi, Electron Holography of Long Range Electrostatic Fields. N. Mori and T. Oikawa, The Imaging Plate and Its Applications. A. De Santis, A. Germani, and L. Jetto, Space-Variant Image Restoration.

巻冊次

v. 100, partial cumulative index ISBN 9780120147427

内容説明

"Advances in Imaging & Electron Physics" merges two long-running serials - "Advances in Electronics and Electron Physics" and "Advances in Optical & Electron Microscopy". The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Volume 100 is a cumulative index for all in-print volumes of "Advances in Electronics and Electron Physics" (Volumes 63-89), "Advances in Imaging & Electron Physics" (Volumes 90-99), and "Advances in Optical & Electron Microscopy" (Volumes 1-14).

目次

Cumulative index for all in-print volumes of: Advances in Electronics and Electron Physics, Volumes 63-89 Advances in Imaging & Electron Physics, Volumes 90-99 Advances in Optical & Electron Microscopy, Volumes 1-14

巻冊次

v. 101 ISBN 9780120147434

内容説明

Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

目次

P.E. Champness, Applications of Transmission Electron Microscopy in Mineralogy. K. Hiraga, High-Resolution Electron Microscopy of Quasicrystals. A. Imiya, Formal Polynomials for Image Processing. M. Molski, The Dual de Broglie Wave. Subject Index.

巻冊次

v. 102 ISBN 9780120147441

内容説明

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

目次

Contributors. Preface. R. Albanese and G. Rubinacci, Finite Element Methods for the Solution of 3D Eddy Current Problems: Introduction. Field Equations and Material Properties. Fields, Potentials, and Gauges. Edge Elements for 3D Field Problems. Integral Formulations for Linear and Nonlinear Eddy Currents. Differential Formulations and Constitutive Error Approach. Discussion and Conclusions. Acknowledgments. References. W. Chen and H. Ahmed, Nanofabricationfor Electronics: Introduction. Nanofabrication Methods. Pattern Transfer. Resolution Limit of Organic Resists. Applications of Nanostructures. References. A.D. Feinerman and D.A. Crewe, Miniature Electron Optics: Introduction. Scaling Lawsfor Electrostatic Lenses. Review. Fabrication of Miniature Magnetostatic Lenses. Electron Source. Detector. Electron Optical Calculations. Performance of a Stacked Einzel Lens. Summary and Future Prospects. References. S.A. Nepijko and N.N. Sedov,Aspects of Mirror Electron Microscopy: Introduction. Resolution of Mirror Electron Microscope. Distortion of Details of Object Image Under Observation in Mirror Electron Microscope. Limiting Sensitivity of Mirror Electron Microscope under Observation of Steps on Object. Image of Islands on Object Surfaces in Mirror Electron Microscope. Calculation of Image Contrast in Mirror Electron Microscope in the Focused Operation Mode. Conclusions. Acknowledgment. References. Subject Index.

巻冊次

v. 103 ISBN 9780120147458

内容説明

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

目次

• Space-time representation of ultra wide-band signals, E. Heyman and T. Melamed
• the structure of relief, J.J. Koenerink and A.J. van Doorn
• Dyadic Green's function microstrip circulator theory for inhomogeneous ferrite with and without penetrable walls, C.M. Krowne
• charged particle opyics of systems with narrow gaps - a perturbation theory approach, M.I. Yavor.

巻冊次

v. 104 : cumulative index ISBN 9780120147465

内容説明

This much needed volume uniquely brings together all previous volumes of this well-known serial. It allows the readers the ability to navigate through the information in all the preceding volumes by using both author and subject indices.

目次

Complete Subject and Author Index, Including Supplements.

巻冊次

v. 105 ISBN 9780120147472

内容説明

Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

目次

A. Astroem and R. Forchheimer, Near-Sensor Image Processing. E. Oho, Digital Image Processing Technology for Scanning Electron Microscopy. H. Suzuki, Electron Gun Systems for Color CRTs. E. Yamazaki, Design and Performance of Shadow-Mask Color CRTs. Subject Index.

巻冊次

v. 106 ISBN 9780120147489

内容説明

Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

目次

M.J. Deen, T.D. Hardy, and R. Murowinski, Effects of Radiation Damage on Scientific Charge Coupled Devices. C.M. Krowne, CAD Using Green's Functions and Finite Elements and Comparison to Experimental Structures for Inhomogeneous Microstrip Circulators. S. Marchard-Maillet and S. Antipolis, Discrete Geometry to Image Processing. H. Ozaktas, M.A. Kutay, and D. Mendlovi, Introduction to the Fractional Fourier Transform and Its Applications. E.H.K. Stelzer and F.M. Haar, Confocal Microscopy. Subject Index.

巻冊次

v. 107 ISBN 9780120147496

内容説明

Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

目次

J. P. Bird, R. Akis, D. Ferry, and M. Stopa, Magneto-Transport as a Probe of Electron Dynamics in Open Quantum Dots. Mohammad F. Alam and Mohammad A. Karim, External Optical Feedback Effects in DFB Semiconductor Lasers. A. Rosenauer and B. Gerthsen, Atomic Scale Strain and Composition Evaluation from High-Resolution Transmission Electron Microscopy Images. R. C. Staunton, Hexagonal Sampling in Imaging Processing. Jeffrey Wood, The Group Representation Network: A General Approach to Invariant Pattern Classification.

巻冊次

v. 109 ISBN 9780120147519

内容説明

Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

目次

Forthcoming Contributions Development and Applications of a New Deep Level Transient Spectroscopy Method and New Averaging Techniques Complex Dyadic Multiresolution Analyses Lattice Vector Quantization for Wavelet-Based Image Coding Fuzzy Cellular Neural Networks and Their Applications to Image Processing Index

巻冊次

v. 110 ISBN 9780120147526

内容説明

Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

巻冊次

v. 111 ISBN 9780120147533

内容説明

Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

巻冊次

v. 112 ISBN 9780120147540

内容説明

Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

巻冊次

v. 113 ISBN 9780120147557

内容説明

Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

巻冊次

v. 114 ISBN 9780120147564

内容説明

Advances in Imaging & Electron Physics merges two long-running serials-Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

巻冊次

v. 115 ISBN 9780120147571

内容説明

Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

巻冊次

v. 117 ISBN 9780120147595

内容説明

Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

巻冊次

v. 118 ISBN 9780120147601

内容説明

Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

巻冊次

v. 120 ISBN 9780120147625

内容説明

Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

巻冊次

v. 122 ISBN 9780120147649

内容説明

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

巻冊次

v. 123 ISBN 9780120147656

内容説明

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

巻冊次

v. 124 ISBN 9780120147663

内容説明

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

目次

V-Vector Algebra and Volterra Filters A Brief Walk Through Sampling Theory Kriging Filters for Space-Time Interpolation Constructions of Orthogonal and Biorthogonal Scaling Functions and Multiwavelets Using Fractal Interpolation Surfaces Diffraction Tomography for Turbid Media Tree-Adapted Wavelet Shrinkage Index

巻冊次

v. 125 ISBN 9780120147670

内容説明

"Advances in Imaging and Electron Physics" merges two long-running serials - "Advances in Electronics and Electron Physics" and "Advances in Optical & Electron Microscopy". It features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

巻冊次

v. 126 ISBN 9780120147687

内容説明

Image processing and a major contribution on microscopy dominate the latest volume of these advances. This volume looks at theory and it's application in a practical sense, with a full account of the methods used and realistic detailed application. The authors do this by examining the latest developments, historic illustrations and mathematical fundamentals of the exciting developments in imaging and applying them to realistic practical situations.Addressing and solving daily issues faced by researchers, consultants and engineers working in this field, makes this book essential reading

目次

A Wavelet-Based Method for Mutlifractal Image Analysis: From Theoretical Concepts to Experimental Applications, An analysis of the Geometric Distortions Produced by Median and Related Image Processing Filters, Two-Photon Excitation Microscopy, Phase Closure Imaging, Three Dimensional Image Processing and Optical Scanning Holography, Nonlinear Image Processing using Artificial Neural Networks

巻冊次

v. 127 ISBN 9780120147694

内容説明

The subjects reviewed in the Advances in Imaging and Electron Physics series cover a broad range of themes including microscopy, electromagnetic fields and image coding. This volume concentrates on microscopy and pattern recognition and also electron physics. The text bridges the gap between academic researchers and R&D designers by addressing and solving daily issues, which makes this book essential reading.

目次

• Scanning Nonlinear Dielectric Microscopy
• High Order Accurate Methods in Time-Domain Computational Electromagnetics
• Pre filtering for Pattern Recognition Using Wavelet Transform and Neural Networks
• Electron Optics and Electron Microscopy: Conference Proceedings and Abstracts as source Material.

巻冊次

v. 128 ISBN 9780120147700

内容説明

The subjects reviewed in the 'Advances' series cover a broad range of themes including microscopy, electromagnetic fields and image coding. Volume 128 concentrates on regularization, a vital aspect of restoration on low voltage scanning electron microscopy.This Book looks at theory and it's application in a practical sense, with a full account of the methods used and realistic detailed application. The authors do this by examining the latest developments, historic illustrations and mathematical fundamentals of the exciting developments in imaging and applying them to realistic practical situationsThe text bridges the gap between academic researchers and R&D designers by addressing and solving daily issues, which makes this book essential reading.

目次

• Fourier, block and lapped transforms
• On fuzzy spatial distances
• Mathematical morphologyapplied to circular data
• Quantum tomography
• Sanning low energy electron microscopy
• Scale space methods & regularization for denoising and inverse problems

巻冊次

v. 129 ISBN 9780120147717

内容説明

Among the subjects reviewed in these Advances, the properties and computation of electromagnetic fields have been considered on several occasions. In particular, the early work of H.F. Harmuth on Maxwell's equations, which was highly controversial at the time, formed a supplement to the series. This volume, unlike previous volumes in the series concentrates solely on the research of professors' Harmuth and Meffert. These studies raise important and fundamental questions concerning some of the basic areas of physics: electromagnetic theory and quantum mechanics. They deserve careful study and reflection for although the authors do not attempt to provide the definitive answer to the questions, their work is undoubtedly a major step towards such an answer. This volume essential reading for those researchers and academics working applied mathematicians or theoretical physics

目次

1. Introduction 2. Differential Equations for the Pure Radiation Field 3. Difference Equations for the Pure Radiation Field 4. Differential Equation for the Klein-Gordon Field 5. Difference Equation for the Klein-Gordon Field 6. Appendix

巻冊次

v. 130 ISBN 9780120147724

内容説明

The subjects reviewed in the Advances in Imaging and Electron Physics series cover a broad range of themes including microscopy, electromagnetic fields and image coding. This volume concentrates on microscopy and pattern recognition and also electron physics. Several of these topics are covered in this volume, which opens with a long chapter of monograph stature on quantitative electron microscopy at the atomic resolution level by scientists from a well-known and very distinguished Antwerp University Laboratory. This is unique in that the statistical aspects are explored fully. This is followed by a contribution by A.M. Grigoryan and S.S. Again on transform-based image enhancement, covering both frequency-ordered systems and tensor approaches. The volume concludes with an account of the problems of image registration and ways of solving them by Maria Petrou of the University of Surrey; feature detection, related image transforms and quality measures are examined separately. The text bridges the gap between academic researchers and R&D designers by addressing and solving daily issues, which makes this book essential reading.

目次

Chapter 1 - Statistical Experimental..., (Van DYCK et al)Chapter 2 - Transform-Based.., (GRIGORYAN/AGAIAN)Chapter 3 - Image Registration (PETROU)

巻冊次

v. 131 ISBN 9780120147731

内容説明

The subjects reviewed in the Advances in Imaging and Electron Physics series cover a broad range of themes including microscopy, electromagnetic fields and image coding. This book is essential reading for electrical engineers, applied mathematicians and robotics experts.

目次

Chapter 1 - Introduction to Hypergraph Theory and Its Use in Engineering and Image Processing (BRETTO)Chapter 2 - Image Segmentation Using the Wigner-Ville Distribution (HORMIGO/CRISTOBAL)Chapter 3 - Statistical and Deterministic Regularities: Utilization of Motion and Grouping in Biological and Artificial Visual Systems (KRUEGER/WORGOTTER)Chapter 4 - The Hopping Electron Cathode for Cathode Ray Tubes (ROSINK et al)

巻冊次

v. 132 ISBN 9780120147748

内容説明

The series bridges the gap between academic researchers and R&D designers by addressing and solving daily issues, which makes it essential reading.This volume looks at theory and it's application in a practical sense, with a full account of the methods used and realistic detailed application. The authors do this by examining the latest developments, historic illustrations and mathematical fundamentals of the exciting developments in imaging and electron physics and apply them to realistic practical situations.

目次

• Evanescent Waves in the Near and the Far Field (ARNOLDUS)
• Symmetry and the Karhunen-Loeve Decomposition (LAHME)
• Analysis of Irregularly Sampled Data: A Review (PIRODDI and PETROU)
• Recent Developments in the Microscopy of Ceramics (RAINFORTH)
• Five Dimensional Hamilton-Jacobi Approach to Relativistic Quantum Mechanics (ROSE)
• Redundant Multiscale Transforms and Their Application for Morphological Component Separation (STARK, ELAD and DONOHO)

巻冊次

v. 134 ISBN 9780120147762

内容説明

Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

目次

• Chapter 1 - Circulant matrix representation of feature masks and its applications (PARK and CHA)
• Chapter 2 - Phase problem and reference beam diffraction (SHEN)
• Chapter 3 - Fractal encoding (VITULANO)Chapter 4 - Morphologically debiassed classifier fusion: A tomography-theoretic approach (WINDRIDGE)

巻冊次

v. 135 ISBN 9780120147779

内容説明

Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

目次

• Chapter 1 - Optics, Mechanics and Hamilton-Jacobi Skeletons (BOUIX and SIDDIQI)
• Chapter 2 - Dynamic Force Microscopy and Spectroscopy (HOLSCHER and SCHIRMEISEN)
• Chapter 3 - Generalized Almost-Cyclostationary Signals (IZZO adn NAPOLITANO)
• Chapter 4 - Virtual Optical Experiments (THALHAMMER)

巻冊次

v. 136 ISBN 9780120147786

内容説明

Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

目次

• Chapter 1 - Real and Complex PDE Based Schemes for Image Shaprening and Enhancement (GILBOA, SOCHEN and ZEEVI)
• Chapter 2 - The S - State Model for Electron Channeling in High Resolution Electron Microscopyv(GEUENS and VAN DYCK)
• Chapter 3 - Measurement of Electric Fields on Object Surface in an Emission Electron Microscope (NEPIJKO, SEDOV and SCHONHENSE)

巻冊次

v. 138 ISBN 9780120147809

内容説明

Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

目次

• Chapter 1 - Spectral Color Spaces: Their Structure and Transformations (LENZ)
• Chapter 2 - Phase Contrast Enhancement with Phase Plates in Electron Microscopy (NAGAYAMA)
• Chapter 3 - A Study of Optical Properties of Gas Phase Field Ionization Sources (LIU and Orloff)
• Chapter 4 - On Symmetric and Nonsymmetric Divergence Measures and Their Generalizations (TANEJA)
• Chapter 5 - Features and Future of the International System of Units (SI) (VALDES)
• Chapter 6 - The Importance Sampling Hough Transform (WALSH)

巻冊次

v. 139 ISBN 9780120147816

内容説明

Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

目次

Retrieval of Shape from Silhouette (A. Bottino, A. Laurentini).Projective Transforms on Periodic Discrete Image Arrays (A. Kingston, I. Svalbe).Ray Tracing in Spherical Interfaces Using Geometric Algebra (Q.M. Sugon, Jr., D.J. McNamara).Prolate Spheroidal Wave Functions and Wavelets (G.G. Walter).

巻冊次

v. 140 ISBN 9780120147823

内容説明

Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

目次

Preface Future contributions Recursive Neural Networks and Their Applications to Image Processing Deterministic Learning and an Application in Optimal Control X-Ray Fluorescence Holography A Taxonomy of Color Image Filtering and Enhancement Solutions General Sweep Mathematical Morphology Index

巻冊次

v. 141 ISBN 9780120147830

内容説明

Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

目次

Grey systems and grey informationY. Lin and S. LiuPhase diversityL. Mugnier, A. Blanc, and J. IdierRecent developments in the imaging of magnetic domains W. Szmaja Stochastic deconvolution over groupsB. Yazici and C.E. Yarman

巻冊次

v. 142 ISBN 9780120147847

内容説明

Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

巻冊次

v. 144 ISBN 9780120147861

内容説明

Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

目次

1. Recent Progress of High Frequency Electron Cyclotron Resonance Ion Sources (HITZ)2. Fixed Points of Lattice Transforms and Lattice Associative Memories (RITTER and GADER) 3. An Extension of Mathematical Morphology to Complex Signals (RIVEST)4. Ranking Metrics and Evaluation Measures (TIAN and SEBE)

巻冊次

v. 145 ISBN 9780123739070

内容説明

Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

目次

Applications of noncausal Guass Markov random processes in multidimensional image processing (A. Asif).Direct detection devices for electron microscopy (A.R. Faruqi).Exploring third-order chromatic aberrations of electron lenses with computer algebra (Zhixiong Liu).Multivalued diffusion PDEs for image regularization, (D. Tschumperle, R. Deriche).

巻冊次

v. 146 ISBN 9780123739087

内容説明

Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

目次

Spiral phase microscopy (S. Furhapter et al.).LULU theory, idempotent stack filters and the mathematics of vision of Marr (C. Rohwer, M. Wild). Geometry of prior selection (H. Snoussi).

巻冊次

v. 147 ISBN 9780123739094

内容説明

Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains

目次

Fuzzy Transforms: A Challenge to Conventional Transforms, by Irina PerfilievaScanning Cathodoluminescence Microscopy, by Chad M. Parish and Phillip E. Russell

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v. 148 ISBN 9780123739100

内容説明

Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

目次

On the Regularization of the Watershed Transform, by F. Meyer and C. VachierInterval and Fuzzy Analysis: A Unified Approach, by W. LodwickPlanar cold cathodes, by V.T Binh and V. Semet

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v. 150 ISBN 9780123742179

内容説明

Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Publication of this 150th volume is an event to be celebrated and, to mark the occasion, the editor has brought together leaders of some of the main themes of past and hopefully of future volumes: electron microscopy, since Ladislaus Marton was one of the pioneers; mathematical morphology, which has often appeared in this series and also fills a supplement, so often cited that it usually appears just as "Academic Press, 1994" (H.J.A.M. Heijmans, Morphological Image Operators, Supplement 25, 1994) with no mention of the Advances; ptychography, a highly original approach to the phase problem, the latter also the subject of a much cited Supplement (W.O. Saxton, 'Computer Techniques for Image Processing in Electron Microscopy', Supplement 10, 1978); and wavelets, which have become a subject in their own right, not just a tool in image processing.

目次

*I. Daubechies, G. Tesche and L. Vese, On some iterative concepts for image restoration *R.F.W. Pease, Significant advances in scanning electron microscopy 1965-2007 *J. M. Rodenburg, Ptychography and related diffractive imaging methods *J. Serra, Advances in mathematical morphology: segmentation

巻冊次

v. 151 ISBN 9780123742186

内容説明

Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. An important feature of these Advances is that the subjects are written in such a way that they can be understood by readers from other specialities.

目次

Bontus & Koehler: Reconstruction Algorithms for Computed TomographyBusin, Vandenbroucke & Macaire: Color spaces and image segmentationEasley & Colonna: Generalized discrete Radon transforms and applications to image processing Radlicka: Lie algebraic methods in charged particle opticsRandle: Recent developments in electron backscatter diffraction

巻冊次

v. 152 ISBN 9780123742193

内容説明

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

目次

Complex-valued neural network and complex-valued BP, by T. Nitta'Disorder', structured diffuse scattering and local crystal chemistry, by R.L. WithersNonlinear systems for image processing, by S. Morfu et al.The Foldy-Wouthuysen transformation technique in optics, by S.A. KhanStack filters: from definition to design algorithms, by N. HirataBlind source separation: the sparsity revolution, by J-L. Sparck et al.

巻冊次

v. 156 ISBN 9780123747624

内容説明

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

目次

1.Photometric Stereo: an overview, M. Petrou, A. Vasileios 2. The Fourier Transform in Clifford Analysis, F. Brackx, N. De Schepper, F. Sommen 3. Carbon nanotube electron sources for electron microscopes, N. de Jonge 4. Localized Waves: A Review, E. Recami, M. Zamboni-Rached

巻冊次

v. 158 ISBN 9780123747693

内容説明

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

目次

1, Surface plasmon enhanced photoemission and electron acceleration with ultrashort laser pulses, Dombi* 2, Physics and the Pioneers of Microscopy, Ford* 3, Image decomposition: theory, numerical schemes and performance evaluation, Gilles* 4, The reverse fuzzy distance transform and its use when studying the shape of macromolecules from cryo-electron tomographic data, Svensson* 5, Anchors of Morphological Operators and Algebraic Openings, Roogenbroeck* 6, Temporal Filtering Technique using Time Lenses for Optical Transmission Systems, Yang, Kumar, Wang

巻冊次

v. 160 ISBN 9780123810175

内容説明

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

目次

1. Gamut Mapping - Zofia Baranczuk, Joachim Giesen, Klaus Simon, Peter Zolliker2. Color Area Morphology Scale-Spaces- Adrian N.Evans3. Harmonic Holography- Ye Pu, Chia-Lung Hsieh, Rachel Grange, Demetri Psaltis4.Lattice Algebra Approach to Endmember Determination in Hyperspectral Imagery- Gerhard X. Ritter, Gonzalo Urcid5. Origin And Background Of The Invention Of The Electron Microscope- Reinhold Rudenberg6. Origin and Background of the Invention of the Electron Microscope: Commentary and Expanded Notes on Memoir of Reinhold Rudenberg- H. Gunther Rudenberg, Paul G. Rudenberg

巻冊次

v. 166 ISBN 9780123813107

内容説明

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

目次

Beam equations Exact solutions to the beam equations Anti-paraxial expansions Solution of the beam formation problem in 3D case Asymptotic theory of 3D flows Geometrized theory Examples of applications

巻冊次

v. 164 ISBN 9780123813121

内容説明

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

目次

Magnetolithography - from the Bottom-Up Route to High Throughput - Amos Bardea and Ron Naaman The Optics of the Spatial Coherence Wavelets - Roman Castaneda Common Diffraction Integral Calculation Based on Fast Fourier Transform Algorithm - LI Junchang, WU Yanmei and LI Yan A generalized approach to describe the interference contrast and the phase contrast method - Marcel Teschke and Stefan Sinzinger Nonlinear partial differential equations for noise problems - Booyong Choi Harmuth Corrigenda - Henning Harmuth

巻冊次

v. 163 ISBN 9780123813145

内容説明

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

目次

Identification Of Historical Pigments In Wall Layers By Combination Of Optical And Scanning Electron Microscopy Coupled To Energy Dispersive Spectroscopy - A. Sever Skapin Optical interference near surfaces and its application in sub-wavelength microscopy - W. S. Bacsa Introduction of a Quantum of Time (\chronon"), and its Consequences for the Electron in Quantum and Classical Physicsy - Ruy H. A Farias and Erasmo RECAMI Superresolution Imaging - Revisited - Markus E. Testorf Methods and Limitations of Subwavelength Imaging Andrew Neice

巻冊次

v. 162 ISBN 9780123813169

内容説明

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

目次

1. Energy Filtered X-ray Photoemission electronmicroscopy(EXPEEM)- Kiyotaka Asakura 2. Image contrast in aberration-corrected scanningconfocal electron microscopy- E.C. Cosgriff 3. Comparison of color demosaicing methods- O. Lossona 4. New dimensions for field emission: effects of structure in the emitting surface- C. J. Edgcombe 5. Conductivity Imaging and Generalised RadonTransform: a review- Archontis Giannakidis 6. Identification Of Historical Pigments In Wall Layers By Combination Of Optical And Scanning Electron Microscopy Coupled To Energy Dispersive Spectroscopy- A. Sever Skapin

巻冊次

v. 161 ISBN 9780123813183

内容説明

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

目次

1. Charged particles in electromagnetic fields2. Language of aberration expansions in charged particle optics3. Transporting charged particle beams in static fields4. Transporting charged particles in radiofrequency fields5. Static magnetic charged particle analyzers6. Electrostatic energy analyzers7. Mass analyzers with combined electrostatic and magnetic fields8. Time-of-flight mass analyzers9. Radiofrequency mass analyzers

巻冊次

v. 165 ISBN 9780123858610

内容説明

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

目次

1. 2D Fourier Transforms in Polar CoordinatesNatalie Baddour2. Superluminal, subluminal, and negative velocities in free-space electromagnetic propagationNeil V. Budko3. Chromatic aberration correction - the next step in electron microscopyRowan Leary and Rik Brydson4. Methods for vectorial analysis and imaging in high-resolution laser microscopy Michele Marrocco5. Image Hierarchy in Gaussian Scale SpaceTomoya Sakai1, Masaki Narita, Takuto, Komazaki, Haruhiko Nishiguchi, Atsushi Imiya6. The Theory of the Boundary Diffraction WaveYusuf Ziya Umul7. History and Solution of the Phase Problem in the Theory of Structure Determination of Crystals from X-ray Di_raction MeasurementsEmil Wolf

巻冊次

v. 169 ISBN 9780123859815

内容説明

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

目次

Identification Of Historical Pigments In Wall Layers By Combination Of Optical And Scanning Electron Microscopy Coupled To Energy Dispersive Spectroscopy - A. Sever Skapin Optical interference near surfaces and its application in sub-wavelength microscopy - W. S. Bacsa Introduction of a Quantum of Time (\chronon"), and its Consequences for the Electron in Quantum and Classical Physicsy - Ruy H. A Farias and Erasmo RECAMI Superresolution Imaging - Revisited - Markus E. Testorf Methods and Limitations of Subwavelength Imaging Andrew Neice

巻冊次

v. 168 ISBN 9780123859839

内容説明

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

目次

The synthesis of a Stochastic Artificial Neural Network application using a Genetic Algorithm approach LucaGeretti, AntonioAbramo Logarithmic Image Processing for Color Images M. Jourlin, J. Breugnot, F. Itthirad, M. Bouabdellah, B. Closs Current Technologies for High Speed and Functional Imaging with Optical Coherence Tomography Rainer A. Leitgeb Analysis of optical systems, contrast depth and measurement of electric and magnetic field distribution on the object's surface in mirror electron microscopy S.A. Nepijko, G. Schoenhense Multivariate statistics applications in scanning transmission electron microscopy X-ray spectrum imaging Chad M. Parish Aberration Correctors developed under Triple C Project Hidetaka Sawada, Fumio Hosokawa, Takeo Sasaki, Toshikatsu Kaneyama, Yukihito Kondo, Kazutomo Suenaga Spatially resolved thermoluminescence in a scanning electron microscope T. Schulz, M. Albrecht, K.Irmscher

巻冊次

v. 167 ISBN 9780123859853

内容説明

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

目次

A History Of Cameca Emmanuel de Chambost Theory and Applications of General Adaptive Neighborhood Image Processing Johan Debayle, Jean-Charles Pinoli Shape Recognition Based on Eigenvalues of the Laplacian M. Ben Haj Rhouma, M.A. Khabou, L. Hermi Point Set Analysis Nicolas Lomenie, Georges Stamon Image recovery from sparse samples, discrete sampling theorem and sharply bounded band limited discrete signals Leonid P. Yaroslavsky

巻冊次

v. 171 ISBN 9780123942975

内容説明

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

目次

Derivation of the Reflection Equations for Higher Order Aberrations of Local Wavefronts by Oblique Incidence G. Esser, W. Becken, W. Muller, P. Baumbach, J. Arasa, D. Uttenweiler Thermal Imaging in Medicine Lila Iznita Izhar and Maria Petrou Derivation of the Radiative Transfer Equation in a Medium with a Spatially Varying Refractive Index: A Review Jean-Michel Tualle Imaging Mass Spectrometry - Sample Preparation, Instrumentation and Applications Kamlesh Shrivas and Mitsutoshi Setou Transformation Optics Robert T. Thompson and Steven A. Cummer TSEM - A Review of Scanning Electron Microscopy in Transmission Mode and Its Applications Tobias Klein, Egbert Buhr and Carl Georg Frase Logarithmic Image Processing: Additive Contrast, Multiplicative Contrast and Associated Metrics M. Jourlina, M. Carre, J. Breugnot and M. Bouabdellah

巻冊次

v. 170 ISBN 9780123943965

内容説明

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

目次

Precession Electron DiffractionA. S. Eggeman and P. A. Midgley Scanning Helium Ion MicroscopyR. Hill, J. A. Notte, and L. Scipioni Signal reconstruction algorithm based on a single intensity in the Fresnel domainHone-Ene Hwang, Pin Han Electron Microscopy Studies on Magnetic L10 FePd NanoparticlesKazuhisa Sato, Toyohiko J. Konno, Yoshihiko Hirotsu Fundamental aspects of Near Field Emission Scanning Electron MicroscopyD. A. Zanin, H. Cabrera, L. De Pietro, M. Pikulski, M. Goldmann, U. Ramsperger, D. Pescia, J. P. Xanthakis

巻冊次

v. 175 ISBN 9780124076709

内容説明

Advances in Imaging and Electron Physics features cutting-edge articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

目次

Small Angle Scatter with Correlation, Scatter and Intermediate Functions Jay Theodore Cremer, Jr. Nuclear Scatter of Neutron Spin States Jay Theodore Cremer, Jr. Atomic-Resolution Core-Level Spectroscopy in the Scanning Transmission Electron Microscope Christian Dwyer Image Segmentation in the Field of the Logarithmic Image Processing (LIP) Model. Special Focus on the Hierarchical Ascendant Classification Techniques Michel Jourlin, Josselin Breugnot, Bassam Abdallah, Joris Corvo, Enguerrand Couka and Maxime Carre Point Spread Function Engineering for Super Resolution Single- and Multi- Photon Fluorescence Microscopy Partha Pratim Mondal and Alberto Diaspro Perspectives on Colour Image Processing by Linear Vector Methods using Projective Geometric Transformations Stephen J. Sangwine

巻冊次

v. 179 ISBN 9780124077003

内容説明

Advances in Imaging and Electron Physics features cutting-edge articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

目次

Invariant Quantum Wave Equations and Double Space-TimeClaude Daviau In-Situ and Correlative Electron MicroscopyNiels de Jonge Electron Tweezers as a Tool for High Precision Manipulation of NanoobjectsVladimir P. Oleshko and James M. Howe Robustness Analysis of the Reduced Fuzzy Texture Spectrum and its Performance on Noisy ImagesPilar Sobrevilla , Eduard Montseny, and Aina Barcelo Measure-by-Wire: An Automatic Control Framework for High-Throughput Transmission Electron MicroscopyArturo Tejada, Wouter Van den Broek, and Arnold J. den Dekker

巻冊次

v. 178 ISBN 9780124077010

内容説明

Advances in Imaging and Electron Physics features cutting-edge articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

目次

Generalized axiomatic scale-space theoryTony Lindeberg Smoothlet Transform: Theory and ApplicationsAgnieszka Lisowska Theory and Computation of Electron Mirrors: The Central Particle MethodEvgeniy M. Yakushev

巻冊次

v. 177 ISBN 9780124077027

内容説明

Advances in Imaging and Electron Physics features cutting-edge articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

目次

Image Segmentation in the ?eld of the Logarithmic Image Processing (LIP) Model. Special Focus on the Hierarchical Ascendant Classi?cation Techniques Michel Jourlin, Josselin Breugnot, Bassam Abdallah, Joris Corvo, Enguerrand Couka, and Maxime Carre Representations for Morphological Image Operators and Analogies with Linear Operators Petros Maragos Electron Microscopy at Cambridge University with Charles Oatley and Ellis Cosslett: Some Reminiscences and Recollections. Kenneth C.A. Smith Advanced Methods of Electron Microscopy in Catalysis ResearchMiguel Jose-Yacaman, Arturo Ponce, Sergio Mejia-Rosales, and Francis Leonard Deepak

巻冊次

v. 180 ISBN 9780124077553

内容説明

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

目次

1. Some Problems of Streak Image Tube DesignM.Ya. Schelev, M.A. Monastyrskiy, N.S. Vorob'ev, S.V. Garnov, and D.E. Greenfield 2. Examples of Streak Image Tube ApplicationM.Ya. Schelev, M.A. Monastyrskiy, N.S. Vorob'ev, S.V. Garnov, and D.E. Greenfield 3. Generation of Ultrashort Electron Bunches for TRED ExperimentsM.Ya. Schelev, M.A. Monastyrskiy, N.S. Vorob'ev, S.V. Garnov, and D.E. Greenfield

巻冊次

v. 176 ISBN 9780124081420

内容説明

Advances in Imaging and Electron Physics features cutting-edge articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

目次

Early History of Wien filters Katsushige Tsuno and Damaschin Ioanoviciu Aberration Theory of Wien Filter Damaschin Ioanoviciu and Katsushige Tsuno Wien Filter Instrumentation Katsushige Tsuno and Damaschin Ioanoviciu Simulation of Multipole Wien Filters Katsushige Tsuno and Damaschin Ioanoviciu Wien Filter Applications to Ions Damaschin Ioanoviciu and Katsushige Tsuno Application of Wien filters to ElectronsKatsushige Tsuno and Damaschin Ioanoviciu

巻冊次

v. 181 ISBN 9780128000915

内容説明

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

目次

Octree Grid Topology Preserving Geometric Deformable ModelYing Bai, Xiao Han and Jerry L. Prince Second Order Variational Models for Image Texture AnalysisMaitine Bergounioux Electron Microscopy of Pharmaceutical SystemsVictoria Klang and Nadejda B. Matsko

巻冊次

v. 185 ISBN 9780128001448

内容説明

Advances in Imaging & Electron Physics merges two long-running serials-Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

目次

Gaussian Beam Propagation in Inhomogeneous Nonlinear Media. Description in Ordinary Differential Equations by Complex Geometrical OpticsPawel Berczynski and Slawomir Marczynski Single-Particle Cryo-Electron Microscopy: Progress, Challenges, and Perspectives for Further Improvement David Agard, Yifan Cheng, Robert M. Glaeser and Sriram Subramaniam Morphological Amoebas and PDEsMartin Welk and Michael Breu

巻冊次

v. 184 ISBN 9780128001455

内容説明

Advances in Imaging & Electron Physics merges two long-running serials-Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

目次

Theory and Data Analysis in Time Resolved Electron DiffractionA.A. Ischenko, S.A. Aseyev Structural Dynamics in Isolated MoleculesA.A. Ischenko, S.A. Aseyev Ultrafast Electron Crystallography and NanocrystallographyA.A. Ischenko, S.A. Aseyev Coherent Dynamics of Nuclei and Electrons: Femtosecond and Attosecond Resolution in TRED TechniqueA.A. Ischenko, S.A. Aseyev Ultrafast Electron MicroscopyA.A. Ischenko, S.A. Aseyev

巻冊次

v. 182 ISBN 9780128001462

内容説明

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

目次

Helmut Ruska (1908-1973): His role in the Evolution of Electron Microscopy in the Life Sciences and Especially VirologyHans R. Gelderblom and Detlev H. Kruger Rainbow LensesNebojsa Neskovic, Petra Belicev, Igor Telecki and Srdjan Petrovic Generalized Sampling: Stable Reconstructions, Inverse Problems and Compressed Sensing Over the ContinuumBen Adcock, Anders Hansen, Bogdan Roman and Gerd Teschke

巻冊次

v. 186 ISBN 9780128002643

内容説明

Advances in Imaging & Electron Physics merges two long-running serials-Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

目次

Practical Aspects of Transmission Electron Microscopy in LiquidNiels de Jonge, Marina Pfaff and Diana B. Peckys Linear Canonical TransformJian-Jiun Ding and Soo-Chang Pei Mechanical, Electrostatic, and Electromagnetic Manipulation of Microobjects and Nanoobjects in Electron MicroscopesAndrey I. Denisyuk, Alexey V. Krasavin, Filipp E. Komissarenko and Ivan S. Mukhin

巻冊次

v. 183 ISBN 9780128002650

内容説明

Advances in Imaging & Electron Physics merges two long-running serials-Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

目次

Towards Quantitative Scanning Electron MicroscopyMohamed M. El-Gomati and Christopher G.H. Walker Logarithmic WaveletsLaurent Navarro, Guy Courbebaisse and Michel Jourlin 3D Sparse RepresentationsFrancois Lanusse, Jean-Luc Starck, Arnaud Woiselle and M. Jalal Fadili

巻冊次

v. 191 ISBN 9780128022535

内容説明

Advances in Imaging & Electron Physics merges two long-running serials-Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

目次

Femtosecond Electron Imaging and SpectroscopyMartin Berz, Philip M. Duxbury, Kyoko Makino and Chong-Yu Ruan Imaging with Electrons, X-rays and Microwaves: Some Scattered ThoughtsRonald E. Burge

巻冊次

v. 188 ISBN 9780128022542

内容説明

Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

目次

Pattern Generators for Reflective Electron-Beam Lithography (REBL)Allen M. Carroll Recent Developments in Time-of-Flight Mass SpectrometryFrank Gunzer and Jurgen Grotemeyer A Special Voice Transform, Analytic Wavelets, and Zernike FunctionsMargit Pap The Hankel Transform in n-dimensions and Its Applications in Optical Propagation and ImagingColin Sheppard

巻冊次

v. 187 ISBN 9780128022559

内容説明

Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

目次

Homeomorphic Manifold Analysis (HMA): Untangling Complex ManifoldsAhmed Elgammal Spin-Polarized Scanning Electron MicroscopyTeruo Kohashi

巻冊次

v. 190 ISBN 9780128023808

内容説明

Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

目次

CISCEM 2014 Niels de Jonge Progress and Development of Direct Detectors for Cryo-Electron MicroscopyA. R. Faruqi, Richard Henderson, and Greg McMullan Electron Optics and Electron Microscopy Conference Proceedings and Abstracts: A Supplement Peter W. Hawkes Scanning Thermal Microscopy (SThM): How to Map Temperature and Thermal Properties at the NanoscaleGrzegorz Wielgoszewski and Teodor Gotszalk

巻冊次

v. 198 ISBN 9780128048108

内容説明

Advances in Imaging and Electron Physics merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices, especially semiconductor devices, particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

目次

1. Direct Digital Electron DetectorsR. Clough and A.I. Kirkland2. Transmission Electron Microscopy: Emerging Investigations for Cultural Heritage MaterialsP. Sciau3. Quest for Ultimate Resolution using Coherent Electron Waves: An Aberration Corrected High-Voltage Electron MicroscopeT. Tanigaki, T. Akashi, Y. Takahashi, T. Kawasaki and H. Shinada

巻冊次

v. 197 ISBN 9780128048115

内容説明

Advances in Imaging and Electron Physics merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

目次

1. Interference of Light and Material Particles, a Departure from the Superposition Principle R. Castaneda, G. Matteucci and R. Capelli 2. Unified Numerical Formalism of Modal Methods in Computational Electromagnetics and Latest Advances: Applications in Nanophotonics and Plasmonics K. Edee, J.P. Plumey and B. Guizal 3. Fundamentals of Focal Series Inline Electron Holography A. Lubk, K. Vogel, D. Wolf, J. Krehl, F. Roeder, L. Clark, G. Guzzinati and J. Verbeeck

巻冊次

v. 196 ISBN 9780128048122

内容説明

Advances in Imaging and Electron Physics merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

目次

1. Quantum Entanglement in Photon-Induced Electron Spectroscopy of Atoms and Molecules: Its Generation, Characterization, and Applications2. Voltage Contrast Modes in a Scanning Electron Microscope and Their Application3. A Review of Scanning Electron Microscopy in Near Field Emission Mode

巻冊次

v. 193 ISBN 9780128048153

内容説明

Advances in Imaging and Electron Physics merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

目次

1. Utilizing the Eigen-Emittance Concept for Bright Electron BeamsLeanne D. Duffy and Alex J. Dragt2. Analytical Methods for the Calculation and Simulation of New Schemes of Static and Time-of-Flight Mass Spectrometers Igor Spivak-Lavrov

巻冊次

v. 204 ISBN 9780128120866

内容説明

Advances in Imaging and Electron Physics, Volume 204, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

目次

1. New physical principle for interference of light and material particles Roman Castaneda and Giorgio Matteucci 2. A Review of Scanning Electron Microscopy in Near Field Emission Mode Taryl L. Kirk 3. Nonscalar Mathematical Morphology Jasper van de Gronde and Jos B.T.M. Roerdink 4. Energy Analysing and Energy Selecting Electron Microscopes A.J.F. Metherel

巻冊次

v. 203 ISBN 9780128120873

内容説明

Advances in Imaging and Electron Physics, Volume 203, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. It features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

目次

• 1. Convolution in (max
• min)-Algebra and Its Role in Mathematical Morphology Jesús Angulo 2. Critical Magnetic Field and Its Slope, Specific Heat, and Gap for Superconductivity as Modified by Nanoscopic Disorder Clifford M. Krowne 3. Mirror Electron Microscopy A. B. Bok, J. B. le Poole, J. Roos and H. de Lang

巻冊次

v. 202 ISBN 9780128120880

内容説明

Advances in Imaging and Electron Physics, Volume 202, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.

目次

1. Non-Negative Sparse Mathematical Morphology Jesús Angulo and Santiago Velasco-Forero 2. Disorder Modifications of the Critical Temperature for Superconductivity – A Perspective from the Point of View of Nanoscience Clifford M. Krowne 3. The Struggle to Overcome Spherical Aberration in Electron Optics Albert Septier

巻冊次

v. 201 ISBN 9780128120897

内容説明

Advances in Imaging and Electron Physics, Volume 201, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, and digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.

目次

Includes contributions from Ashkan Ashrafi Sameen Ahmed Khan Michael S. Isaacson

巻冊次

v. 200 ISBN 9780128120903

内容説明

Advances in Imaging and Electron Physics, Volume 200, the latest release in a series that merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and computing methods. Topics in this latest release include Past and Present Attempts to Attain the Resolution Limit of the Transmission Electron Microscope, Phase Plates for Transmission Electron Microscopy, and X-Ray Lasers in Biology: Structure and Dynamics.

目次

1. Past and Present Attempts to Attain the Resolution Limit of the Transmission Electron MicroscopeErnst Ruska2. Phase Plates for Transmission Electron MicroscopyChristopher J. Edgcombe3. X-Ray Lasers in Biology: Structure and DynamicsJohn C.H Spence

巻冊次

v. 199 ISBN 9780128120910

内容説明

Advances in Imaging and Electron Physics, Volume 199, the latest release in a series that merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy features extended articles on the physics of electron devices (especially semiconductor devices). Specific topics include discussions on Micro-XRF in scanning electron microscopes, and an interesting take on the variational approach for simulation of equilibrium ion distributions in ion traps regarding Coulomb interaction, amongst others. Users will find a comprehensive resource on the most important aspects of particle optics at high and low energies, microlithography, image science and digital image processing. In addition, topics of interest, including electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains are presented and discussed.

目次

1. Micro-XRF in Scanning Electron MicroscopesM. Haschke and S. Boehm2. A Variational Approach for Simulation of Equilibrium Ion Distributions in Ion Traps with Regard to Coulomb InteractionI.A. Kopaev, D. Grinfeld, M.A. Monastyrskiy, R.S. Ablizen, S.S. Alimpiev and A.A. Trubitsyn3. Analytical Review of Direct STEM Imaging Techniques for Thin SamplesI. Lazic and E.G.T. Bosch4. Quantum Nano-Optics in the Electron MicroscopeL.H.G. Tizei and M. Kociak5. Component Identification and Interpretation: A Perspective on Tower of KnowledgeM. Xu, J. Ren and Z. Wang

巻冊次

v. 208 ISBN 9780128152140

内容説明

Advances in Imaging and Electron Physics, Volume 208, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.

目次

1. Review of a Bewildering Classical-Quantum Phenomenon: Ghost Imaging Bernhard .J. Hoenders 2. The Early Electron Microscopes: Incubation John van Gorkom 3. Three-Dimensional Computer Modeling of Electron Optical Systems John A. Rouse

巻冊次

v. 207 ISBN 9780128152157

内容説明

Advances in Imaging and Electron Physics, Volume 207, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.

目次

Contributions from: Florent Houdellier Inder Jeet Taneja Karl-Joseph Hanszen

巻冊次

v. 206 ISBN 9780128152164

内容説明

Advances in Imaging and Electron Physics, Volume 206, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

目次

1. Holography and Tomography with Electrons Axel Lubk 2. Paraxial Quantum Mechanics Axel Lubk 3. Tomography Axel Lubk 4. Electron Optics in Phase Space Axel Lubk 5. Electron Holography in Phase Space Axel Lubk 6. Electron Holographic Tomography Axel Lubk 7. Summary and Outlook Axel Lubk

巻冊次

v. 205 ISBN 9780128152171

内容説明

Advances in Imaging and Electron Physics, Volume 205 is the latest release in this series that merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

目次

1. The Early Electron Microscopes, a Critical Study John van Gorkom, Dirk van Delft and Ton van Helvoort 2. Electron Optics of Low-Voltage Electron Beam Testing and Inspection. Part I: Simulation Tools Erich Plies

巻冊次

v. 209 ISBN 9780128171776

内容説明

Advances in Imaging and Electron Physics, Volume 209, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.

目次

1. Introduction to EELS Alberto Eljarrat Ascunce 2. Low-loss EELS methods Alberto Eljarrat Ascunce 3. DFT modeling of wurtzite III-nitride ternary alloys Alberto Eljarrat Ascunce 4. AlN/GaN and InAlN/GaN DBRs Alberto Eljarrat Ascunce 5. Multiple InGaN QW heterostructure Alberto Eljarrat Ascunce 6. Er-doped Si-nc/SiO2 multilayer Alberto Eljarrat Ascunce 7. Si-NCs embedded in dielectric matrices Alberto Eljarrat Ascunce 8. EELS Conclusions Alberto Eljarrat Ascunce 9. High-Tc Superconductors and Magnetic Electron Lenses Jan-Peter Adriaanse

巻冊次

v. 210 ISBN 9780128171837

内容説明

Advances in Imaging and Electron Physics, Volume 210, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains. Sections in this new release cover Electron energy loss spectroscopy at high energy losses, Examination of 2D Hexagonal Band Structure from a Nanoscale Perspective for use in Electronic Transport Devices, and more.

目次

1. Introduction to the Examination of 2D Hexagonal Band Structure from a Nanoscale Perspective for Use in Electronic Transport Devices Clifford M. Krowne 2. Determination of Reciprocal Lattice from Direct Space in 3D and 2D Clifford M. Krowne 3. Tight-Binding Formulation of Electronic Band Structure of Hexagonal Materials Clifford M. Krowne 4. Evaluation of the Matrix Elements for the Tight-Binding Formulation of Hexagonal Materials Clifford M. Krowne 5. Solving the Secular Equation of the System for Eigenenergy Clifford M. Krowne 6. Properties of the Bare Shifted Eigenenergy Determined as a Function of k Vector Clifford M. Krowne 7. Hamiltonian of the Two Atom Sublattice System Clifford M. Krowne 8. 2-Spinor and 4-Spinor Wavefunctions and Hamiltonians Clifford M. Krowne 9. Examination of the Relativistic Dirac Equation and Its Implications Clifford M. Krowne 10. Different Onsite Energies for the Two Atom Problem Clifford M. Krowne 11. Overall Conclusion Clifford M. Krowne 12. Performing EELS at Higher Energy Losses at Both 80 and 200 kV Ian MacLaren, Rebecca B. Cummings, Fraser Gordon, Enrique Frutos-Myro, Sam McFadzean, Andy Brown, and Alan Craven

巻冊次

v. 211 ISBN 9780128174692

内容説明

Advances in Imaging and Electron Physics, Volume 211, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.

目次

1. Simulation of atomically resolved elemental maps with a multislice algorithm for relativistic electrons Stephan Majert and Helmut Kohl 2. Reviewing the revised International System of Units (SI) Joaquin Valdes 3. Electron energy loss spectroscopy in the electron microscope Christian Colliex

巻冊次

v. 212 ISBN 9780128174753

内容説明

Advances in Imaging and Electron Physics, Volume 212, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.

目次

Part I. Papers from the Tenth International Conference on Charged Particle Optics 1. Planar multi-reflecting time-of-flight mass-spectrometer of a simple design Seitkerim B. Bimurzaev 2. Generalization of paraxial trajectory method for the analysis of non-paraxial rays Shin Fujita 3. Test and characterization of a new post-column imaging energy filter Frank Kahl, Volker Gerheim, Martin Linck, Heiko Muller, Richard Schillinger, Stephan Uhlemann 4. Electron optics for a multi-pass transmission electron microscope Marian Mankos, Stewart A. Koppell, Brannon B. Klopfer, Thomas Juffmann, Vladimir Kolarik, Khashayar Shadman, Mark Kasevich 5. A simulation program for electron mirrors using Boundary Element Method Eric Munro, Haoning Liu, Catherine Rouse, John Rouse 6. An algorithm for simulating the geometric optics of charged particle instruments Khashayar Shadman Part II. The Nano-aperture Ion Source 7. Introduction to focused ion beams, ion sources, and the nano-aperture ion source Leon van Kouwen 8. Nano-fluidic flow in the nano-aperture ion source Leon van Kouwen 9. Optics of ion emission from the nano-aperture ion source Leon van Kouwen 10. A model for ion-neutral scattering in the nano-aperture source Leon van Kouwen 11. Ion emission simulations of the nano-aperture ion source Leon van Kouwen 12. Processes in the ionization volume of the nano-aperture ion source Leon van Kouwen

巻冊次

v. 213 ISBN 9780128209974

内容説明

Advances in Imaging and Electron Physics, Volume 213, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.

目次

Part 1: Quantum degeneracy 1. Partially coherent quantum degenerate electron matter waves Sam Keramati, Eric Jones, Jeremy Armstrong, Herman Batelaan Part 2: The contribution of atom probe tomography to the correlation of the optical and structural properties of semiconductor nanostructures 2. Laser-assisted atom probe tomography Lorenzo Rigutti 3. Inaccuracies in atom probe measurements of semiconductor composition Lorenzo Rigutti 4. Atom probe-based correlative microscopy Lorenzo Rigutti 5. In-situ optical spectroscopy within an atom probe Lorenzo Rigutti Part 3: CPO Proceedings Papers 6. Derivation, Cross-Validation, and Comparison of Analytic Formulas for Electrostatic Deflector Aberrations Eremey Valetov, Martin Berz 7. Analysis and Fringe Field Scaling of a Legacy Set of Electrostatic Deflector Aberration Formulas Eremey Valetov Part 4: Advances in Optical Electron Microscopy 8. Scanning Optical Microscopy C. J. R. Sheppard

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詳細情報

• NII書誌ID(NCID): BA24211536
• ISBN:
  • 0120147327
  • 0120147335
  • 0120147343
  • 0120147351
  • 012014736X
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  • 9780128023808
  • 9780128022535
  • 9780128048153
  • 9780128048122
  • 9780128048115
  • 9780128048108
  • 9780128120910
  • 9780128120903
  • 9780128120897
  • 9780128120880
  • 9780128120873
  • 9780128120866
  • 9780128152171
  • 9780128152164
  • 9780128152157
  • 9780128152140
  • 9780128171776
  • 9780128171837
  • 9780128174692
  • 9780128174753
  • 9780128209974
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: San Diego ; Tokyo
• ページ数/冊数: v.
• 大きさ: 24 cm