2010 28th VLSI Test Symposium (VTS2010), Santa Cruz, California, USA, 19-22 April 2010

Author(s)

• IEEE VLSI Test Symposium

Bibliographic Information

2010 28th VLSI Test Symposium (VTS2010), Santa Cruz, California, USA, 19-22 April 2010

IEEE, c2010

Other Title

2010 28th IEEE VLSI Test Symposium : VTS2010

CFP10029-PRT

Note

"IEEE Catalog Number: CFP10029-PRT"

Details

• NCID: BB0315646X
• ISBN:
  • 9781424466498
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Piscataway, N.J.
• Pages/Volumes: xxvii, 358 p.
• Size: 28 cm