Possible reliability problems affecting use of TOEIC IP Test scores

Author(s)

• Bresnihan, Brian D.

Bibliographic Information

Possible reliability problems affecting use of TOEIC IP Test scores

Brian D. Bresnihan

（兵庫県立大学政策科学研究叢書, v. 83）

Institute for Policy Analysis and Social Innovation, University of Hyogo, 2010

Note

"University of Hyogo Monograph Vol. LXXXII"--T.p. verso

Includes bibliographical references

Details

• NCID: BB0382858X
• Country Code: ja
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Kobe
• Pages/Volumes: 329 p.
• Size: 21 cm
• Classification:
  • NDC8 : 802
  • NDLC : KE41
• Parent Bibliography ID:
  • BB0368472X