Possible reliability problems affecting use of TOEIC IP Test scores
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Possible reliability problems affecting use of TOEIC IP Test scores
(兵庫県立大学政策科学研究叢書, v. 83)
Institute for Policy Analysis and Social Innovation, University of Hyogo, 2010
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"University of Hyogo Monograph Vol. LXXXII"--T.p. verso
Includes bibliographical references