Methodology
Author(s)
Bibliographic Information
Methodology
(Sample preparation handbook for transmission electron microscopy)
Springer, c2010
- : pbk
Available at 6 libraries
  Aomori
  Iwate
  Miyagi
  Akita
  Yamagata
  Fukushima
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  Tochigi
  Gunma
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  Niigata
  Toyama
  Ishikawa
  Fukui
  Yamanashi
  Nagano
  Gifu
  Shizuoka
  Aichi
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  Shiga
  Kyoto
  Osaka
  Hyogo
  Nara
  Wakayama
  Tottori
  Shimane
  Okayama
  Hiroshima
  Yamaguchi
  Tokushima
  Kagawa
  Ehime
  Kochi
  Fukuoka
  Saga
  Nagasaki
  Kumamoto
  Oita
  Miyazaki
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  Okinawa
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Note
Includes bibiliographical references and index
"Softcover re-print of the hardcover 1st edition 2010"--T.p. verso of paperback edition
Description and Table of Contents
Description
Successful transmission electron microscopy in all of its manifestations depends on the quality of the specimens examined. Biological specimen preparation protocols have usually been more rigorous and time consuming than those in the physical sciences. For this reason, there has been a wealth of scienti?c literature detailing speci?c preparation steps and numerous excellent books on the preparation of b- logical thin specimens. This does not mean to imply that physical science specimen preparation is trivial. For the most part, most physical science thin specimen pre- ration protocols can be executed in a matter of a few hours using straightforward steps. Over the years, there has been a steady stream of papers written on various aspects of preparing thin specimens from bulk materials. However, aside from s- eral seminal textbooks and a series of book compilations produced by the Material Research Society in the 1990s, no recent comprehensive books on thin spe- men preparation have appeared until this present work, ?rst in French and now in English. Everyone knows that the data needed to solve a problem quickly are more imp- tant than ever. A modern TEM laboratory with supporting SEMs, light microscopes, analytical spectrometers, computers, and specimen preparation equipment is an investment of several million US dollars. Fifty years ago, electropolishing, chemical polishing, and replication methods were the principal specimen preparation me- ods.
Table of Contents
Methodology: General Introduction.- to Materials.- The Different Observation Modes in Electron Microscopy (SEM, TEM, STEM).- Materials Problems and Approaches for TEM and TEM/STEM Analyses.- Physical and Chemical Mechanisms of Preparation Techniques.- Artifacts in Transmission Electron Microscopy.- Selection of Preparation Techniques Based on Material Problems and TEM Analyses.- Comparisons of Techniques.- Conclusion: What Is a Good Sample?.
by "Nielsen BookData"