Characterization of organic thin films

Author(s)

• Ulman, Abraham
• Strausser, Yale
• McGuire, Gray E.

Bibliographic Information

Characterization of organic thin films

[Abraham Ulman] ; editors, Yale Strausser and Gray E. McGuire

（Materials characterization series : surfaces, interfaces, thin films / series editors, C. Richard Brundle, Charles A. Evans, Jr.）

Momentum Press, c2010

Note

"First published by Butterworth-Heinemann in 1995" -- T.p. verso

Includes bibliographical references and index

Details

• NCID: BB04790664
• ISBN:
  • 9781606500446
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: New York, N.Y.
• Pages/Volumes: xvii, 276 p.
• Size: 24 cm
• Parent Bibliography ID:
  • BB04791113