Characterization of organic thin films
著者
書誌事項
Characterization of organic thin films
（Materials characterization series : surfaces, interfaces, thin films / series editors, C. Richard Brundle, Charles A. Evans, Jr.）
Momentum Press, c2010
大学図書館所蔵 件 / 全2件
-
該当する所蔵館はありません
- すべての絞り込み条件を解除する
注記
"First published by Butterworth-Heinemann in 1995" -- T.p. verso
Includes bibliographical references and index
内容説明・目次
内容説明
Thin films based upon organic materials are at the heart of much of the revolution in modern technology, from advanced electronics, to optics to sensors to biomedical engineering. This volume in the Materials Characterization series introduces the major common types of analysis used in characterizing of thin films and the various appropriate characterization technologies for each. Materials such as Langmuir-Blodgett films and self-assembled monolayers are first introduced, followed by analysis of surface properties and the various characterization technologies used for such. Readers will find detailed information on:
Various spectroscopic approaches to characterization of organic thin films, including infrared spectroscopy and Raman spectroscopyX-Ray diffraction techniques, High Resolution EELS studies, and X-Ray Photoelectron SpectroscopyConcise Summaries of major characterization technologies for organic thin films, including Auger Electron Spectroscopy, Dynamic Secondary Ion Mass Spectrometry, and Transmission Electron Microscopy (TEM)
「Nielsen BookData」 より