Structural, syntactic, and statistical pattern recognition : joint IAPR international workshop, SSPR & SPR 2010 : Cesme, Izmir, Turkey, August 18 - 20, 2010 : proceedings

著者

• Hancock, Edwin R
• Wilson, Richard C.
• Windeatt, Terry
• Ulusoy, Ilkay
• Escolano, Francisco

書誌事項

Structural, syntactic, and statistical pattern recognition : joint IAPR international workshop, SSPR & SPR 2010 : Cesme, Izmir, Turkey, August 18 - 20, 2010 : proceedings

Edwin R. Hancock ... [et al.](eds.)

（Lecture notes in computer science, 6218）

Springer, 2010

注記

Includes index

詳細情報

• NII書誌ID(NCID): BB04903818
• ISBN:
  • 9783642149795
• 出版国コード: gw
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Berlin
• ページ数/冊数: xv, 758p.
• 大きさ: 24cm
• 親書誌ID:
  • BA00009279