ISTFA '94 : proceedings of the 20th International Symposium for Testing and Failure Analysis, 13-18 November 1994, Los Angeles, California

著者

• International Symposium for Testing and Failure Analysis (20th : 1994 : Los Angeles, Calif.)
• ASM International. Electronic Materials and Processing Division

書誌事項

ISTFA '94 : proceedings of the 20th International Symposium for Testing and Failure Analysis, 13-18 November 1994, Los Angeles, California

sponsored by ASM International

ASM International, c1994

注記

Includes bibliographical references

詳細情報

• NII書誌ID(NCID): BB09625315
• ISBN:
  • 0871705435
• LCCN: 94072803
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Materials Park, Ohio
• ページ数/冊数: xiii, 505 p.
• 大きさ: 28 cm
• 分類:
  • LCC : TK7871
• 件名:
  • LCSH : Electronics -- Materials -- Testing -- Congresses
  • LCSH : Electronic apparatus and appliances -- Testing -- Congresses