Silicon-based millimeter-wave technology : measurement, modeling and applications
Author(s)
Bibliographic Information
Silicon-based millimeter-wave technology : measurement, modeling and applications
(Advances in imaging and electron physics / edited by Peter W. Hawkes, v. 174)
Academic Press, 2012
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The Institute for Solid State Physics Library. The University of Tokyo.図書室
549:A4:1747210344235
Note
Includes bibliographical references and index
Description and Table of Contents
Description
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Table of Contents
Measurement Techniques and Practical Issues
Jamal Deen
Transmission lines and passive components
Guennadi A. Kouzaev
Modeling and Design of High Frequency Structures Using Artificial Neural Networks and Space Mapping
Mohamed Bakr
Field-effect types of transistors
Benjamin Iniguez
RF MEMS Switches and Switch Matrices
Mojgan Daneshmand
Substrate-Integrated Antennas on Silicon
Natalia K. Nikolova
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