Silicon-based millimeter-wave technology : measurement, modeling and applications

Author(s)

• Deen, M. Jamal

Bibliographic Information

Silicon-based millimeter-wave technology : measurement, modeling and applications

guest editor, M. Jamal Deen

（Advances in imaging and electron physics / edited by Peter W. Hawkes, v. 174）

Academic Press, 2012

Note

Includes bibliographical references and index

Description and Table of Contents

Description

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Table of Contents

Measurement Techniques and Practical Issues Jamal Deen Transmission lines and passive components Guennadi A. Kouzaev Modeling and Design of High Frequency Structures Using Artificial Neural Networks and Space Mapping Mohamed Bakr Field-effect types of transistors Benjamin Iniguez RF MEMS Switches and Switch Matrices Mojgan Daneshmand Substrate-Integrated Antennas on Silicon Natalia K. Nikolova

by "Nielsen BookData"

Details

• NCID: BB11046467
• ISBN:
  • 9780123942982
• Country Code: ne
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Amsterdam
• Pages/Volumes: xix, 483 p., [15] p. of plates
• Size: 24 cm
• Classification:
  • DC23 : 621.384
• Subject Headings:
  • LCSH : Millimeter wave communication systems
• Parent Bibliography ID:
  • BA24211536