Interferometry principles and applications

Author(s)

    • Russo, Mark E.

Bibliographic Information

Interferometry principles and applications

Mark E. Russo, editor

(Physics research and technology)

Nova Science Publishers, c2012

  • : hardcover

Available at  / 1 libraries

Search this Book/Journal

Note

Includes bibliographical references and index

Description and Table of Contents

Description

Interferometry makes use of the principle of superposition to combine separate waves together in a way that will cause the result of their combination to have some meaningful property that is diagnostic of the original state of the waves. This book presents current research in the principles and applications of interferometry. Topics discussed include speckle methods for material analysis; using White Light Interferometry for accurate topographic measurements of surfaces; cyclic path interferometric configuration applications; phase-stepping algorithms; periodic error measurement for heterodyne interferometry and high contrast Schlieren diffraction interferometry..

Table of Contents

  • Preface
  • Speckle Methods for Material Analysis
  • The Production & Accurate Measurement of a 1 Millimeter Step Standard Using a Commercial & a Laboratory White Light Interferometer
  • Cyclic Path Interferometric Configuration: Some Applications
  • Single-Shot Phase-Grating Phase-Shifting Interferometry
  • SAR Interferometry Fundamentals & Historic Evolution in Terrain Movements Applications
  • High Contrast Schlieren Diffraction Interferometry
  • Binary Grating Interferometry with Two Windows
  • Electronic Speckle Pattern Interferometry: Principles & Applications
  • Periodic Error Measurement for Heterodyne Interferometry
  • Maximum Likelihood Estimation of Optical Signal Parameters
  • Phase-Stepping Algorithms: Overview & Simulations
  • Generalized Carre Multi-Step Phase-Shifting Algorithms.

by "Nielsen BookData"

Related Books: 1-1 of 1

Details

  • NCID
    BB13127118
  • ISBN
    • 9781612093475
  • LCCN
    2010051595
  • Country Code
    us
  • Title Language Code
    eng
  • Text Language Code
    eng
  • Place of Publication
    New York
  • Pages/Volumes
    xv, 572 p.
  • Size
    26 cm
  • Classification
  • Subject Headings
  • Parent Bibliography ID
Page Top