Spreading resistance analysis for silicon layers with nonuniform resistivity

著者

• Dickey, David H.
• Ehrstein, James R.

書誌事項

Spreading resistance analysis for silicon layers with nonuniform resistivity

David H. Dickey and James R. Ehrstein

（NBS special publication, 400-48 . Semiconductor measurement technology）

U.S. G.P.O., 1979

電子リソースにアクセスする 全2件

• Spreading resistance analysis for silicon layers with nonuniform resistivity / David H. Dickey and James R. Ehrstein.

  1979

  HathiTrust

  

• Spreading resistance analysis for silicon layers with nonuniform resistivity / David H. Dickey, Solecon Laboratories, and James R. Ehrstein, Electron Devices Division, Center for Electronics & Electrical Engineering, National Engineering Laboratory, National Bureau of Standards.

  1979

  HathiTrust

  

詳細情報

• NII書誌ID(NCID): BB18855531
• LCCN: 79607012
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Washington
• ページ数/冊数: vi, 65 p.
• 大きさ: 26 cm
• 分類:
  • LCC : QC100
  • LCC : TK7871.85
  • DC : 602/.1 s
  • DC : 621.3815/2/028
• 件名:
  • LCSH : Semiconductors -- Testing
  • LCSH : Electric resistance, Spreading
  • LCSH : Silicon -- Electric properties
• 親書誌ID:
  • BA0011083X