Lock-in thermography : basics and use for evaluating electronic devices and materials
Author(s)
Bibliographic Information
Lock-in thermography : basics and use for evaluating electronic devices and materials
（Advanced microelectronics, 10）
Springer, c2010
2nd ed
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Note
Includes bibliographical references (p. 235-244) and index
Description and Table of Contents
Description
This is the first book on lock-in thermography, an analytical method applied to the diagnosis of microelectronic devices. This useful introduction and guide reviews various experimental approaches to lock-in thermography, with special emphasis on the lock-in IR thermography developed by the authors themselves.
Table of Contents
Physical and Technical Basics.- Experimental Technique.- Theory.- Measurement Strategies.- Typical Applications.- Summary and Outlook.
by "Nielsen BookData"