Lock-in thermography : basics and use for evaluating electronic devices and materials
著者
書誌事項
Lock-in thermography : basics and use for evaluating electronic devices and materials
（Advanced microelectronics, 10）
Springer, c2010
2nd ed
大学図書館所蔵 件 / 全1件
-
該当する所蔵館はありません
- すべての絞り込み条件を解除する
注記
Includes bibliographical references (p. 235-244) and index
内容説明・目次
内容説明
This is the first book on lock-in thermography, an analytical method applied to the diagnosis of microelectronic devices. This useful introduction and guide reviews various experimental approaches to lock-in thermography, with special emphasis on the lock-in IR thermography developed by the authors themselves.
目次
Physical and Technical Basics.- Experimental Technique.- Theory.- Measurement Strategies.- Typical Applications.- Summary and Outlook.
「Nielsen BookData」 より