Advanced transmission electron microscopy : imaging and diffraction in nanoscience

Author(s)

• Zuo, Jian Min
• Spence, John C. H.

Bibliographic Information

Advanced transmission electron microscopy : imaging and diffraction in nanoscience

[by] Jian Min Zuo, John C.H. Spence

Springer, c2017

• : [hardcover]

Note

Includes bibliographical references (p. 644-652) and indexes

Details

• NCID: BB24356693
• ISBN:
  • 9781493966059
• LCCN: 2016947937
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: New York
• Pages/Volumes: xxvi, 729 p.
• Size: 25 cm