Scanning electron microscopy and X-ray microanalysis

著者

• Goldstein, Joseph
• Newbury, Dale E.
• Michael, Joseph R.
• Ritchie, Nicholas W. M.
• Scott, John Henry J.
• Joy, David C.

書誌事項

Scanning electron microscopy and X-ray microanalysis

Joseph I. Goldstein ... [et al.]

Springer Science+Business Media, 2018

4th ed

• : [hbk.]

注記

Includes bibliographical references and index

Other authors: Dale E. Newbury, Joseph R. Michael, Nicholas W.M. Ritchie, John Henry J. Scott, David C. Joy

"Extras online"--Cover

詳細情報

• NII書誌ID(NCID): BB25623321
• ISBN:
  • 9781493966745
• LCCN: 2017943045
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: New York
• ページ数/冊数: xxiii, 550 p.
• 大きさ: 29 cm
• 分類:
  • DC23 : 502.825
  • NDC9 : 549.97
• 件名:
  • LCSH : Electron microscopy
  • LCSH : Scanning electron microscopy
  • LCSH : X-ray microanalysis