Scanning electron microscopy and X-ray microanalysis

Author(s)

• Goldstein, Joseph
• Newbury, Dale E.
• Michael, Joseph R.
• Ritchie, Nicholas W. M.
• Scott, John Henry J.
• Joy, David C.

Bibliographic Information

Scanning electron microscopy and X-ray microanalysis

Joseph I. Goldstein ... [et al.]

Springer Science+Business Media, 2018

4th ed

• : [hbk.]

Note

Includes bibliographical references and index

Other authors: Dale E. Newbury, Joseph R. Michael, Nicholas W.M. Ritchie, John Henry J. Scott, David C. Joy

"Extras online"--Cover

Details

• NCID: BB25623321
• ISBN:
  • 9781493966745
• LCCN: 2017943045
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: New York
• Pages/Volumes: xxiii, 550 p.
• Size: 29 cm
• Classification:
  • DC23 : 502.825
  • NDC9 : 549.97
• Subject Headings:
  • LCSH : Electron microscopy
  • LCSH : Scanning electron microscopy
  • LCSH : X-ray microanalysis