Chemical mechanical polishing 2000 -- fundamentals and materials issues : symposium held April 26-27, 2000, San Francisco, California, U.S.A.

著者

    • Singh, Rajiv K
    • Bajaj, Rajeev
    • Moinpour, Mansour
    • Meuris, Marc

書誌事項

Chemical mechanical polishing 2000 -- fundamentals and materials issues : symposium held April 26-27, 2000, San Francisco, California, U.S.A.

editors, Rajiv K. Singh ... [et al.]

(Materials Research Society symposium proceedings, v. 613)

Materials Research Society , Cambridge University Press, 2013

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注記

Includes bibliographical references and indexes

"First paperback edition 2013"--T.p. verso

内容説明・目次

内容説明

Chemical-mechanical polishing (CMP) is a critical technology in the planarization of multilevel metallization systems and shallow-trench isolation in semiconductor manufacturing. Other emerging applications for this technology include flat-panel displays, magnetic data storage and microelectromechanical systems. The rapid emergence of copper as the conducting material for integrated circuits has further pushed CMP technology to the forefront of semiconductor manufacturing. However, a basic understanding of the CMP process, which is necessary to enable further advances, is inadequate. This book, first published in 2001, provides an insight into the fundamental processes in CMP. Presentations from academia, government institutions and industry are featured. Topics include: CMP mechanisms; dielectric and metal CMP; process integration and manufacturability; and CMP consumables.

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詳細情報

  • NII書誌ID(NCID)
    BB2767463X
  • ISBN
    • 9781107413146
  • 出版国コード
    us
  • タイトル言語コード
    eng
  • 本文言語コード
    eng
  • 出版地
    Warrendale, PA,Cambridge ; New York
  • ページ数/冊数
    1 v.
  • 大きさ
    23 cm
  • 親書誌ID
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