Testing's changing role : International Test Conference, 1983 : proceedings, October 18-20, 1983

著者

• International Test Conference
• IEEE Computer Society. Test Technology Committee
• Institute of Electrical and Electronics Engineers. Philadelphia Section

書誌事項

Testing's changing role : International Test Conference, 1983 : proceedings, October 18-20, 1983

sponsored by the IEEE Computer Society, Test Technology Committee, IEEE Philadelphia Section

IEEE Computer Society Press, 1983

タイトル別名

International Test Conference 1983 proceedings

83CH1933-1

83CH19331

注記

Spine title: International Test Conference 1983 proceedings

"IEEE catalog no. 83CH1933-1."

"Computer Society order no. 502."

Includes bibliographical references and index

• NII書誌ID(NCID): BB30101937
• ISBN:
  • 0818605022
• LCCN: 83081805
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Silver Spring, MD
• ページ数/冊数: xxv, 806 p.
• 大きさ: 28 cm
• 分類:
  • LCC : TK7874
  • DC19 : 621.381/7/0287
• 件名:
  • LCSH : Integrated circuits -- Testing -- Congresses
  • LCSH : Electronic digital computers -- Circuits -- Testing -- Congresses
  • LCSH : Automatic test equipment -- Congresses