Testing in the 1980's : digest of papers, 1981 International Test Conference, October 27, 28 & 29, 1981

Author(s)

• International Test Conference
• IEEE Computer Society. Test Technology Committee
• Institute of Electrical and Electronics Engineers. Philadelphia Section

Bibliographic Information

Testing in the 1980's : digest of papers, 1981 International Test Conference, October 27, 28 & 29, 1981

sponsored by the IEEE Computer Society, Test Technology Committee, and the Philadelphia Section of the IEEE

Institute of Electrical and Electronics Engineers , order from IEEE Computer Society, c1981

Other Title

IEEE 1981 Test Conference

1981 International Test Conference, Franklin Plaza Hotel, Philadelphia, Pa., October 27-29, 1981

81CH1693-1

81CH16931

Note

Includes bibliographical references and index

"IEEE catalog no. 81CH1693-1."

"IEEE Computer Society catalog no. 375."

Details

• NCID: BC03586502
• LCCN: 81082806
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: New York, NY,Los Angeles, CA
• Pages/Volumes: xxiv, 568 p.
• Size: 29 cm
• Classification:
  • LCC : TK7874
  • DC19 : 621.381/7/0287
• Subject Headings:
  • LCSH : Integrated circuits -- Testing -- Congresses
  • LCSH : Electronic digital computers -- Circuits -- Testing -- Congresses
  • LCSH : Automatic test equipment -- Congresses