Testing in the 1980's : digest of papers, 1981 International Test Conference, October 27, 28 & 29, 1981

著者

• International Test Conference
• IEEE Computer Society. Test Technology Committee
• Institute of Electrical and Electronics Engineers. Philadelphia Section

書誌事項

Testing in the 1980's : digest of papers, 1981 International Test Conference, October 27, 28 & 29, 1981

sponsored by the IEEE Computer Society, Test Technology Committee, and the Philadelphia Section of the IEEE

Institute of Electrical and Electronics Engineers , order from IEEE Computer Society, c1981

タイトル別名

IEEE 1981 Test Conference

1981 International Test Conference, Franklin Plaza Hotel, Philadelphia, Pa., October 27-29, 1981

81CH1693-1

81CH16931

注記

Includes bibliographical references and index

"IEEE catalog no. 81CH1693-1."

"IEEE Computer Society catalog no. 375."

詳細情報

• NII書誌ID(NCID): BC03586502
• LCCN: 81082806
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: New York, NY,Los Angeles, CA
• ページ数/冊数: xxiv, 568 p.
• 大きさ: 29 cm
• 分類:
  • LCC : TK7874
  • DC19 : 621.381/7/0287
• 件名:
  • LCSH : Integrated circuits -- Testing -- Congresses
  • LCSH : Electronic digital computers -- Circuits -- Testing -- Congresses
  • LCSH : Automatic test equipment -- Congresses