Quality productivity profit : digest of papers : 1982 International Test Conference, November 15-18, 1982

著者

• International Test Conference
• IEEE Computer Society. Test Technology Committee
• International Test Foundation
• IEEE Computer Society
• Institute of Electrical and Electronics Engineers. Philadelphia Section

書誌事項

Quality productivity profit : digest of papers : 1982 International Test Conference, November 15-18, 1982

presented by the Test Technology Committee, the International Test Formation [i.e. Foundation] ; sponsored by IEEE Computer Society, IEEE Philadelphia Section

IEEE Computer Society Press, c1982

タイトル別名

IEEE 1982 International Test Conference

1982 International Test Conference, November 15-18, 1982

82CH1808-5

82CH18085

注記

Includes bibliographical references and index

IEEE catalog no. 82CH1808-5

Computer Society order no. 444

詳細情報

• NII書誌ID(NCID): BC0364364X
• LCCN: 82082293
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Silver Spring, MD
• ページ数/冊数: xxiii, 672 p.
• 大きさ: 29 cm
• 分類:
  • LCC : TK7874
  • DC19 : 621.381/73/0287
• 件名:
  • LCSH : Integrated circuits -- Testing -- Congresses
  • LCSH : Automatic test equipment -- Congresses