Optical characterization techniques for high-performance microelectronic device manufacturing III : 16-17 October 1996, Austin, Texas
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書誌事項
Optical characterization techniques for high-performance microelectronic device manufacturing III : 16-17 October 1996, Austin, Texas
(Proceedings / SPIE -- the International Society for Optical Engineering, v. 2877)
SPIE, c1996
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Optical characterization techniques for high-performance microelectronic device manufacturing 3
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注記
Includes bibliographical references and index