Machine vision applications in industrial inspection XII : 21-22 January, 2004, San Jose, California, USA

著者

書誌事項

Machine vision applications in industrial inspection XII : 21-22 January, 2004, San Jose, California, USA

Jeffery R. Price, Fabrice Mériaudeau, chairs/editors ; sponsored ... by IS & T--the Society for Imaging Science and Technology, SPIE--the International Society for Optical Engineering

（Proceedings of Electronic Imaging Science and Technology）（Proceedings / SPIE -- the International Society for Optical Engineering, v. 5303）

SPIE, c2004

  • pbk.

タイトル別名

Proceedings of electronic imaging science and technology

Electronic imaging science and technology

Machine vision applications in industrial inspection 12

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注記

Includes bibliographical references and index

内容説明・目次

内容説明

Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

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