Optical measurement systems for industrial inspection III : 23-26 June 2003, Munich, Germany

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書誌事項

Optical measurement systems for industrial inspection III : 23-26 June 2003, Munich, Germany

Wolfgang Osten, Katherine Creath, Malgorzata Kujawinska, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering ; cosponsored by EOS--European Optical Society [and] WLT--Wissenschaftliche Gesellschaft Lasertechnik e.V. (Germany)

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 5144）

SPIE, c2003

タイトル別名

Optical measurement systems for industrial inspection 3

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注記

Includes bibliographical references and index

内容説明・目次

内容説明

At head of title: proceedings of SPIE, SPIE--the Society for Optical Engineering.

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    SPIE -- the International Society for Optical Engineering

    SPIE -- the International Society for Optical Engineering

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