Sixth International Conference on Quality Control by Artificial Vision : 19-22 May 2003, Gatlinberg, Tennessee, USA

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Sixth International Conference on Quality Control by Artificial Vision : 19-22 May 2003, Gatlinberg, Tennessee, USA

Kenneth W. Tobin, Jr., Fabrice Meriaudeau, chairs/editors ; sponsored by UT-Battelle ... [et al.] in cooperation with IEEE Signal Processing Society, SPIE--the International Society for Optical Engineering, [and] Machine Vision Association of SME--Society of Manufacturing Engineers (USA)

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 5132）

SPIE, c2003

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6th International Conference on Quality Control by Artificial Vision

International Conference on Quality Control by Artificial Vision

Quality control by artificial vision

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Includes bibliographical references and index

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  • Proceedings

    SPIE -- the International Society for Optical Engineering

    SPIE -- the International Society for Optical Engineering

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