Sixth International Conference on Quality Control by Artificial Vision : 19-22 May 2003, Gatlinberg, Tennessee, USA

著者

• International Conference on Quality Control by Artificial Vision
• Tobin, Kenneth W.
• Meriaudeau, Fabrice
• UT-Battelle, LLC
• IEEE Signal Processing Society
• Society of Photo-optical Instrumentation Engineers
• Machine Vision Association of SME

書誌事項

Sixth International Conference on Quality Control by Artificial Vision : 19-22 May 2003, Gatlinberg, Tennessee, USA

Kenneth W. Tobin, Jr., Fabrice Meriaudeau, chairs/editors ; sponsored by UT-Battelle ... [et al.] in cooperation with IEEE Signal Processing Society, SPIE--the International Society for Optical Engineering, [and] Machine Vision Association of SME--Society of Manufacturing Engineers (USA)

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 5132）

SPIE, c2003

タイトル別名

6th International Conference on Quality Control by Artificial Vision

International Conference on Quality Control by Artificial Vision

Quality control by artificial vision

注記

Includes bibliographical references and index

• NII書誌ID(NCID): BC1622189X
• ISBN:
  • 0819449989
• LCCN: 2004296749
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Bellingham, Wash., USA
• ページ数/冊数: xii, 594 p.
• 大きさ: 28 cm
• 分類:
  • LCC : TS156.2
  • DC22 : 670.42/5
• 件名:
  • LCSH : Quality control -- Optical methods -- Congresses
  • LCSH : Computer vision -- Industrial applications -- Congresses
  • LCSH : Imaging systems -- Quality control -- Congresses
  • LCSH : Pattern recognition systems -- Quality control -- Congresses
  • LCSH : Optical detectors -- Congresses
• 親書誌ID:
  • BA0022700X