Aberration theory in electron and ion optics

Bibliographic Information

Aberration theory in electron and ion optics

Ximen Jiye ; edited by Peter W. Hawkes, Martin Hÿtch

(Advances in imaging and electron physics, v. 226)

Academic Press, c2023

Available at  / 5 libraries

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Includes bibliographical references and indexes

Description and Table of Contents

Description

Advances in Imaging and Electron Physics, Volume 227 in the Advances in Imaging and Electron Physics series, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.

Table of Contents

The electron optical imaging system and its aberrations Jiye Ximen The electromagnetic deflection system and its aberrations Jiye Ximen The electromagnetic multipole system and its aberrations Jiye Ximen The ion optical system and its aberrations Jiye Ximen Computer aided design of electron and ion optical systems Jiye Ximen Afterword: Life and works of Jiye Ximen Peter Hawkes

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Details

  • NCID
    BD02801367
  • ISBN
    • 9780443193200
  • Country Code
    uk
  • Title Language Code
    eng
  • Text Language Code
    eng
  • Place of Publication
    London
  • Pages/Volumes
    xxiv, 349 p.
  • Size
    24 cm
  • Classification
  • Subject Headings
  • Parent Bibliography ID
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