Aberration theory in electron and ion optics

書誌事項

Aberration theory in electron and ion optics

Ximen Jiye ; edited by Peter W. Hawkes, Martin Hÿtch

(Advances in imaging and electron physics, v. 226)

Academic Press, c2023

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注記

Includes bibliographical references and indexes

内容説明・目次

内容説明

Advances in Imaging and Electron Physics, Volume 227 in the Advances in Imaging and Electron Physics series, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.

目次

The electron optical imaging system and its aberrations Jiye Ximen The electromagnetic deflection system and its aberrations Jiye Ximen The electromagnetic multipole system and its aberrations Jiye Ximen The ion optical system and its aberrations Jiye Ximen Computer aided design of electron and ion optical systems Jiye Ximen Afterword: Life and works of Jiye Ximen Peter Hawkes

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詳細情報

  • NII書誌ID(NCID)
    BD02801367
  • ISBN
    • 9780443193200
  • 出版国コード
    uk
  • タイトル言語コード
    eng
  • 本文言語コード
    eng
  • 出版地
    London
  • ページ数/冊数
    xxiv, 349 p.
  • 大きさ
    24 cm
  • 分類
  • 件名
  • 親書誌ID
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