High resolution electron microscopy of defects in materials : symposium held April 16-18, 1990, San Francisco, California, USA

Author(s)

• Sinclair, Robert
• Smith, David J.
• Dahmen, Ulrich
• Materials Research Society

Bibliographic Information

High resolution electron microscopy of defects in materials : symposium held April 16-18, 1990, San Francisco, California, USA

editors, Robert Sinclair, David J. Smith, Ulrich Dahmen

（Materials Research Society symposium proceedings, v. 183）

Materials Research Society, c1990

Note

Inclcudes bibliographical references

Includes index

Details

• NCID: BA11043199
• ISBN:
  • 1558990720
• LCCN: 90041466
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Pittsburgh, Pa.
• Pages/Volumes: xi, 391 p.
• Size: 24 cm
• Classification:
  • LCC : TA417.23
  • DC20 : 620.1/1299
• Subject Headings:
  • LCSH : Materials -- Microscopy -- Congresses
  • LCSH : Materials -- Defects -- Congresses
  • LCSH : Electron microscopy -- Congresses
• Parent Bibliography ID:
  • BA00013775