High resolution electron microscopy of defects in materials : symposium held April 16-18, 1990, San Francisco, California, USA

著者

• Sinclair, Robert
• Smith, David J.
• Dahmen, Ulrich
• Materials Research Society

書誌事項

High resolution electron microscopy of defects in materials : symposium held April 16-18, 1990, San Francisco, California, USA

editors, Robert Sinclair, David J. Smith, Ulrich Dahmen

（Materials Research Society symposium proceedings, v. 183）

Materials Research Society, c1990

注記

Inclcudes bibliographical references

Includes index

詳細情報

• NII書誌ID(NCID): BA11043199
• ISBN:
  • 1558990720
• LCCN: 90041466
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Pittsburgh, Pa.
• ページ数/冊数: xi, 391 p.
• 大きさ: 24 cm
• 分類:
  • LCC : TA417.23
  • DC20 : 620.1/1299
• 件名:
  • LCSH : Materials -- Microscopy -- Congresses
  • LCSH : Materials -- Defects -- Congresses
  • LCSH : Electron microscopy -- Congresses
• 親書誌ID:
  • BA00013775