Bibliographic Information

IEEE design & test of computers

IEEE Computer Society [and] the Institute of Electrical and Electronics Engineers, Inc

IEEE Computer Society, c[1984]-2012

  • Vol. 1, no. 1 (Feb. 1984)-v. 29, no. 6 (Nov./Dec. 2012)

Other Title

IEEE des. test comput (Print)

IEEE design & test of computers (Print)

IEEE design and test of computers

Design & test of computers

Design and test of computers

IEEE design & test

Institute of Electrical and Electronics Engineers design and test of computers

Available at  / 98 libraries

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Note

Title from cover

Vol. 1, no. 1 also called premiere issue

Issued also in microfiche

Quarterly, 1984; bimonthly, 1985-

Place of publication varies: New York, N.Y.

Continues by:1

  • IEEE design & test

    IEEE

    Institute of Electrical and -Electronics -Engineers 2013-

    Available at 3 libraries

Details

  • NCID
    AA10630714
  • ISSN
    07407475
  • LCCN
    91641150
  • Country Code
    us
  • Title Language Code
    eng
  • Text Language Code
    eng
  • Place of Publication
    [Los Alamitos, Calif.]
  • Publication Status
    Dead Status
  • Frequency
    Bimonthly
  • Regularity
    Regular
  • Type of Continuing Resource
    Periodical
  • Bibliographic History ID
    42187900
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