Proceedings of the 13th International Conference on Defects in Semiconductors

著者

• International Conference on Defects in Semiconductors
• Kimerling, L. C.
• Parsey, J. M. (John Michael) Jr.
• Metallurgical Society of AIME. Electronic Materials Committee

書誌事項

Proceedings of the 13th International Conference on Defects in Semiconductors

Thirteenth International Conference on Defects in Semiconductors; sponsored by the Electronic Materials Committee of the Metallurgical Society of AIME, held at Coronado, California, August 12-17, 1984 ; edited by L.C. Kimerling and J.M. Parsey, Jr.

Metallurgical Society of AIME, c1985

注記

Includes bibliographies and indexes

詳細情報

• NII書誌ID(NCID): BA00608648
• ISBN:
  • 0895204851
• LCCN: 84062228
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Warrendale, Pa.
• ページ数/冊数: xxiii, 1252 p.
• 大きさ: 24 cm
• 分類:
  • LCC : QC611.6.D4
  • DC19 : 621.3815/2
• 件名:
  • LCSH : Semiconductors -- Defects -- Congresses