Electron microscopy in solid state physics
著者
書誌事項
Electron microscopy in solid state physics
（Materials science monographs, 40）
Elsevier, 1987
- タイトル別名
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Elektronenmikroskopie in der Festkörperphysik
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注記
Rev. and updated translation of: Elektronenmikroskopie in der Festkörperphysik -- T.p. verso
Includes bibliographies and index
内容説明・目次
内容説明
In almost all fields of research of science, engineering and medicine, electron microscopy as a method of directly imaging submicroscopic structures has become increasingly important. This book reports on the capabilities and limitations of the application of electron microscopy to solid state physics and materials science. The book is divided into two parts. In the first part, the methods of electron microscope examination employed in solid state physics are described, with special reference to the reliable interpretation of electron micrographs. The second part of the book deals with applications and covers those fields of solid state physics and materials science to which electron microscopy may appreciably contribute. The book is intended as a review for a wide circle of readers including solid state physicists and materials scientists. Those already familiar with electron microscopy will appreciate the up-to-date information on the latest methods and applications. Those who are not so familiar with electron microscopy will find the book to be a valuable introduction to the various fields of application, illustrated by a wealth of specially chosen examples.
目次
1. Methods of Investigation in Electron Microscopy. Conventional electron microscopy: fundamentals of electron optics and instrumentation (H. Bethge, J. Heydenreich). Conventional electron microscopy: image formation (J. Heydenreich, W. Neumann). Electron diffraction: fundamentals and application (W. Neumann, K. Scheerschmidt). High-resolution electron microscopy (W. Neumann, R. Hillebrand, P. Werner). High-voltage electron microscopy (G. Kastner). Scanning electron microscopy: electron-optical and technical fundamentals of the instrument (H. Johansen, U. Werner). Scanning electron microscopy: physical foundations of contrast formation (U. Werner, H. Johansen). Indirect imaging of surfaces by replica and decoration techniques (H. Bethge, M. Krohn, H. Stenzel). Special methods for direct imaging of surfaces: emission electron microscopy, reflection electron microscopy and mirror electron microscopy (H. Bethge, J. Heydenreich). Analytical electron microscopy: combined imaging, diffraction and spectroscopical methods (W. Rechner, R. Schneider). Image processing in electron microscopy (W. Neumann, R. Hillebrand, T. Krajewski). 2. Applications in Solid State Physics. Lattice defect imaging by diffraction contrast (K. Scheerschmidt, R. Gleichmann). Basic processes of plastic deformation (U. Messerschmidt, F. Appel). Microprocesses of fracture (V. Schmidt). Fractography with the SEM (failure analysis) (M. Moser). Morphology of polymers (G.H. Michler). Defects in semiconductors and devices (R. Gleichmann, H. Blumtritt, P. Werner). Molecular processes in crystal growth (K.W. Keller, H. Hoche). Growth and structure of thin films (M. Klaua). Dislocation arrangements in grain boundaries and interphase boundaries (R. Scholz, J. Woltersdorf). The domain structure of ferroelectric and ferromagnetic solids (D. Hesse, K.-P. Meyer). Appendices: The theoretical foundation of diffraction contrast in the electron microscope for lattice defect imaging and its computer simulation (K. Scheerschmidt). Transmission electron microscopy: a survey of preparation techniques (H. Bartsch). Subject Index.
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