Recent development of electron microscopy : proceedings of the Second Chinese-Japanese Electron Microscopy Seminar held in Beijing from October 17 to October 19 in 1983

著者

• Chinese-Japanese Electron Microscopy Seminar
• 橋本, 初次郎 ハシモト, ハツジロウ
• Chung-kuo tien tzu hsien wei ching hsüeh hui

書誌事項

Recent development of electron microscopy : proceedings of the Second Chinese-Japanese Electron Microscopy Seminar held in Beijing from October 17 to October 19 in 1983

organized by Chinese Society of Electron Microscopy ; edited by H. Hashimoto ... [et al.]

International Dept., Business Center for Academic Societies Japan, c1985

注記

Includes bibliographies and index

詳細情報

• NII書誌ID(NCID): BA04238405
• ISBN:
  • 4930813115
• LCCN: 86205567
• 出版国コード: ja
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Tokyo, Japan
• ページ数/冊数: 279 p.
• 大きさ: 23 cm
• 分類:
  • LCC : QH212.E4
  • DC19 : 502/.8/25
• 件名:
  • LCSH : Electron microscopy -- Congresses