X-ray microscopy and X-ray microanalysis : proceedings of the Second International Symposium (Stockholm, 1960)

Author(s)

• International Symposium on X-ray Optics and X-ray Microanalysis
• Engström, Arne
• Cosslett, V.
• Pattee, H.

Bibliographic Information

X-ray microscopy and X-ray microanalysis : proceedings of the Second International Symposium (Stockholm, 1960)

edited by A. Engström, V. Cosslett, H. Pattee

Elsevier, 1960

Other Title

X-Ray microscopy and microanalysis

Note

Papers in English, German, or French

Includes bibliographies

Details

• NCID: BA06274556
• LCCN: 60012354
• Country Code: ne
• Title Language Code: eng
• Text Language Code: enggerfre
• Place of Publication: Amsterdam ; New York
• Pages/Volumes: x, 542 p.
• Size: 25 cm
• Classification:
  • LCC : QC373.X2
  • DC : 537.5352
• Subject Headings:
  • LCSH : X-ray microscope -- Congresses
  • LCSH : Microradiography -- Congresses