Physical measurement and analysis of thin films

Author(s)

• Eastern Analytical Symposium
• Murt, E. M.
• Guldner, W. G.

Bibliographic Information

Physical measurement and analysis of thin films

edited by E. M. Murt and W. G. Guldner

（Progress in analytical chemistry, v. 2）

Plenum Press, 1969

Note

Includes bibliographies

• NCID: BA11236002
• LCCN: 68031239
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: New York
• Pages/Volumes: xi, 194 p.
• Size: 24 cm
• Classification:
  • LCC : QC176
  • DC : 530.4/1
• Subject Headings:
  • LCSH : Thin films -- Addresses, essays, lectures
• Parent Bibliography ID:
  • BA11236090