Nondestructive evaluation of semiconductor materials and devices

著者

• NATO Advanced Study Institute on Nondestructive Evaluation of Semiconductor Materials and Devices
• Zemel, Jay N.

書誌事項

Nondestructive evaluation of semiconductor materials and devices

edited by Jay N. Zemel

（NATO advanced study institutes series, Series B . Physics ; v. 46）

Plenum Press, c1979

注記

Lectures presented at the NATO Advanced Study Institute on Nondestructive Evaluationof Semiconductor Materials and Devices, held at the Villa Tuscolano, Italy,September 19-29, 1978

Includes bibliographical references and index

"Published in cooperation with NATO Scientific Affairs Division."

詳細情報

• NII書誌ID(NCID): BA13158566
• ISBN:
  • 0306402939
• LCCN: 79016499
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: New York
• ページ数/冊数: xi, 782 p.
• 大きさ: 26 cm
• 分類:
  • LCC : TK7871.85
  • DC : 621.3815/2/028
• 件名:
  • LCSH : Semiconductors -- Testing -- Congresses
• 親書誌ID:
  • BA00221036