Surface analysis methods in materials science
Author(s)
Bibliographic Information
Surface analysis methods in materials science
（Springer series in surface sciences, 23）
Springer-Verlag, c1992
- : gw
- : us
Available at / 43 libraries
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The Institute for Solid State Physics Library. The University of Tokyo.図書室
: gw428.7:S147210062878
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Note
Includes bibliographical references and index
Description and Table of Contents
Description
This detailed and up-to-date guide to the use of surface analysis methods in materials science consists of three parts: an extensive introduction to the concepts of surface structure and composition, a techniques section describing 14 surface methods and a separate section on applications. Each chapter is written by a specialist in the field. The surface methods described include SAM, XPS, SIMS and other ion beam methods, LEED/RHEED, RBS and NRA, FTIR, SEM, STM, UPS and magnetic methods. Among the areas of application discussed are adsorption, catalysis, coated steel surfaces, inorganic surfaces, semiconductor devices, thin film solar cells and high temperature oxidation. This detailed exposition aims to enable researchers to select and exploit the appropriate surface method for a given application.
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