Surface analysis methods in materials science
著者
書誌事項
Surface analysis methods in materials science
（Springer series in surface sciences, 23）
Springer-Verlag, c1992
- : gw
- : us
大学図書館所蔵 件 / 全43件
-
該当する所蔵館はありません
- すべての絞り込み条件を解除する
注記
Includes bibliographical references and index
内容説明・目次
内容説明
This detailed and up-to-date guide to the use of surface analysis methods in materials science consists of three parts: an extensive introduction to the concepts of surface structure and composition, a techniques section describing 14 surface methods and a separate section on applications. Each chapter is written by a specialist in the field. The surface methods described include SAM, XPS, SIMS and other ion beam methods, LEED/RHEED, RBS and NRA, FTIR, SEM, STM, UPS and magnetic methods. Among the areas of application discussed are adsorption, catalysis, coated steel surfaces, inorganic surfaces, semiconductor devices, thin film solar cells and high temperature oxidation. This detailed exposition aims to enable researchers to select and exploit the appropriate surface method for a given application.
「Nielsen BookData」 より