Digest of papers : Eleventh Annual 1993 IEEE VLSI Test Symposium, April 6-8, 1993, Atlantic City, New Jersey

Author(s)

• IEEE VLSI Test Symposium
• IEEE Computer Society. Technical Committee on Test Technology
• Institute of Electrical and Electronics Engineers. Philadelphia Section

Bibliographic Information

Digest of papers : Eleventh Annual 1993 IEEE VLSI Test Symposium, April 6-8, 1993, Atlantic City, New Jersey

sponsored by the IEEE Computer Society, Technical Committee-Test Technology and the Philadelphia Section of the IEEE

IEEE Computer Society Press, c1993

• : soft.
• : micro.

Other Title

Eleventh Annual 1993 IEEE VLSI Test Symposium

The Eleventh IEEE VLSI Test Symposium : design, test, and application: systems on silicon

93TH05371

Note

"With special thanks to Texas A&M University for their support"

"IEEE catalog number 93TH0537-1"

Includes bibliographical references and index

Details

• NCID: BA20854341
• ISBN:
  • 0818638303
  • 0818638311
• LCCN: 93077453
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Los Alamitos
• Pages/Volumes: xiii, 365 p.
• Size: 28 cm
• Classification:
  • LCC : TK7874.6
  • DC20 : 621.39/5
• Subject Headings:
  • LCSH : Application specific integrated circuits -- Congresses
  • LCSH : Application specific integrated circuits -- Testing -- Congresses
  • LCSH : Application specific integrated circuits -- Design -- Congresses