Digest of papers : Eleventh Annual 1993 IEEE VLSI Test Symposium, April 6-8, 1993, Atlantic City, New Jersey

著者

• IEEE VLSI Test Symposium
• IEEE Computer Society. Technical Committee on Test Technology
• Institute of Electrical and Electronics Engineers. Philadelphia Section

書誌事項

Digest of papers : Eleventh Annual 1993 IEEE VLSI Test Symposium, April 6-8, 1993, Atlantic City, New Jersey

sponsored by the IEEE Computer Society, Technical Committee-Test Technology and the Philadelphia Section of the IEEE

IEEE Computer Society Press, c1993

• : soft.
• : micro.

タイトル別名

Eleventh Annual 1993 IEEE VLSI Test Symposium

The Eleventh IEEE VLSI Test Symposium : design, test, and application: systems on silicon

93TH05371

注記

"With special thanks to Texas A&M University for their support"

"IEEE catalog number 93TH0537-1"

Includes bibliographical references and index

詳細情報

• NII書誌ID(NCID): BA20854341
• ISBN:
  • 0818638303
  • 0818638311
• LCCN: 93077453
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Los Alamitos
• ページ数/冊数: xiii, 365 p.
• 大きさ: 28 cm
• 分類:
  • LCC : TK7874.6
  • DC20 : 621.39/5
• 件名:
  • LCSH : Application specific integrated circuits -- Congresses
  • LCSH : Application specific integrated circuits -- Testing -- Congresses
  • LCSH : Application specific integrated circuits -- Design -- Congresses