12th IEEE VLSI Test Symposium : proceedings, April 25-28, 1994, Cherry Hill, New Jersey

著者

• IEEE VLSI Test Symposium
• IEEE Computer Society. Technical Committee on Test Technology
• Institute of Electrical and Electronics Engineers. Philadelphia Section

書誌事項

12th IEEE VLSI Test Symposium : proceedings, April 25-28, 1994, Cherry Hill, New Jersey

sponsored by IEEE Computer Society Technical Committee on Test Technology, IEEE Philadelphia Section

IEEE Computer Society Press, c1994

• : pbk

タイトル別名

Twelfth IEEE VLSI Test Symposium

94TH06452

注記

"IEEE catalog number 94TH0645-2"--T.p. verso

Includes bibliographical references and index

詳細情報

• NII書誌ID(NCID): BA23949717
• ISBN:
  • 0818654406
• LCCN: 94075000
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Los Alamitos, Calif.
• ページ数/冊数: xviii, 466 p.
• 大きさ: 28 cm
• 分類:
  • LCC : TK7874
  • DC20 : 621.39/5/0287
• 件名:
  • LCSH : Integrated circuits -- Very large scale integration -- Testing -- Congresses