12th IEEE VLSI Test Symposium : proceedings, April 25-28, 1994, Cherry Hill, New Jersey

Author(s)

• IEEE VLSI Test Symposium
• IEEE Computer Society. Technical Committee on Test Technology
• Institute of Electrical and Electronics Engineers. Philadelphia Section

Bibliographic Information

12th IEEE VLSI Test Symposium : proceedings, April 25-28, 1994, Cherry Hill, New Jersey

sponsored by IEEE Computer Society Technical Committee on Test Technology, IEEE Philadelphia Section

IEEE Computer Society Press, c1994

• : pbk

Other Title

Twelfth IEEE VLSI Test Symposium

94TH06452

Note

"IEEE catalog number 94TH0645-2"--T.p. verso

Includes bibliographical references and index

Details

• NCID: BA23949717
• ISBN:
  • 0818654406
• LCCN: 94075000
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Los Alamitos, Calif.
• Pages/Volumes: xviii, 466 p.
• Size: 28 cm
• Classification:
  • LCC : TK7874
  • DC20 : 621.39/5/0287
• Subject Headings:
  • LCSH : Integrated circuits -- Very large scale integration -- Testing -- Congresses