Records of the IEEE International Workshop on Memory Technology, Design, and Testing, August 8-9, 1994, San Jose, California

Author(s)

• IEEE International Workshop on Memory Testing
• Rajsuman, Rochit
• IEEE Computer Society. Test Technology Technical Committee
• IEEE Computer Society. Technical Committee on VLSI

Bibliographic Information

Records of the IEEE International Workshop on Memory Technology, Design, and Testing, August 8-9, 1994, San Jose, California

edited by R. Rajsuman ; sponsored by IEEE Computer Society Technical Committee on Test Technology in cooperation with the IEEE Computer Society Technical Committee on VLSI

IEEE Computer Society Press, c1994

Other Title

94TH06569

Note

"IEEE catalog number 94TH0656-9"--T.p. verso

Includes bibliographical references and index

Details

• NCID: BA24796509
• ISBN:
  • 081866245X
• LCCN: 94075844
• Country Code: us
• Title Language Code: eng
• Place of Publication: Los Alamitos, Calif.
• Pages/Volumes: ix, 141 p.
• Size: 28 cm
• Classification:
  • LCC : TK7895.M4
  • DC20 : 621.39/732
• Subject Headings:
  • LCSH : Semiconductor storage devices -- Testing -- Congresses
  • LCSH : Random access memory -- Congresses