Records of the IEEE International Workshop on Memory Technology, Design, and Testing, August 8-9, 1994, San Jose, California

著者

• IEEE International Workshop on Memory Testing
• Rajsuman, Rochit
• IEEE Computer Society. Test Technology Technical Committee
• IEEE Computer Society. Technical Committee on VLSI

書誌事項

Records of the IEEE International Workshop on Memory Technology, Design, and Testing, August 8-9, 1994, San Jose, California

edited by R. Rajsuman ; sponsored by IEEE Computer Society Technical Committee on Test Technology in cooperation with the IEEE Computer Society Technical Committee on VLSI

IEEE Computer Society Press, c1994

タイトル別名

94TH06569

注記

"IEEE catalog number 94TH0656-9"--T.p. verso

Includes bibliographical references and index

詳細情報

• NII書誌ID(NCID): BA24796509
• ISBN:
  • 081866245X
• LCCN: 94075844
• 出版国コード: us
• タイトル言語コード: eng
• 出版地: Los Alamitos, Calif.
• ページ数/冊数: ix, 141 p.
• 大きさ: 28 cm
• 分類:
  • LCC : TK7895.M4
  • DC20 : 621.39/732
• 件名:
  • LCSH : Semiconductor storage devices -- Testing -- Congresses
  • LCSH : Random access memory -- Congresses