ID:DA09002934
International Workshop on Memory Testing, IEEE
Workshop on Memory Testing, IEEE International
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edited by Rochit Rajsuman, Yong-Khim Swee, Lee-Yee Lau ; sponsored by IEEE Computer Society Technical Committee on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid State Circuits Council
IEEE Computer Society Press c1996
Available at 1 libraries
edited by R. Rajsuman and K. Rajkanan ; sponsored by the IEEE Computer Society Technical Committee on Test Technology, the IEEE Computer Society Technical Committee on VLSI ; in cooperation with the IEEE Solid State Circuits Council
IEEE Computer Society Press c1995
Available at 2 libraries
edited by R. Rajsuman ; sponsored by IEEE Computer Society Technical Committee on Test Technology in cooperation with the IEEE Computer Society Technical Committee on VLSI
IEEE Computer Society Press c1994
Available at 3 libraries