13th IEEE VLSI Test Symposium : April 30-May 3, 1995, Princeton, New Jersey : proceedings

Author(s)

• IEEE VLSI Test Symposium
• IEEE Computer Society. Technical Committee on Test Technology
• Institute of Electrical and Electronics Engineers. Philadelphia Section

Bibliographic Information

13th IEEE VLSI Test Symposium : April 30-May 3, 1995, Princeton, New Jersey : proceedings

sponsored by IEEE Computer Society Technical Committee on Test Technology, IEEE Philadelphia Section

IEEE Computer Society Press, c1995

• pbk.

Other Title

Thirteenth IEEE VLSI Test Symposium

Note

Includes bibliographical references and index

Details

• NCID: BA25972389
• ISBN:
  • 0818670002
• LCCN: 94072870
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Los Alamitos, Calif.
• Pages/Volumes: xx, 493 p.
• Size: 28 cm
• Classification:
  • LCC : TK7874
  • DC20 : 621.39/5/0287
• Subject Headings:
  • LCSH : Integrated circuits -- Very large scale integration -- Testing -- Congresses