Trace characterization : chemical and physical

Author(s)

• Materials Research Symposium
• Meinke, W. Wayne
• Scribner, Bourdon F. (Bourdon Francis)
• Institute for Materials Research (U.S.)

Bibliographic Information

Trace characterization : chemical and physical

W. Wayne Meinke and Bourdon F. Scribner, editors

（National Bureau of Standards monograph, 100）

Dept. of Commerce, National Bureau of Standards ; for sale by the Supt. of Docs., U.S. G.P.O., 1967

Note

"Based on lectures and discussions of the 1st Materials Research Symposium held at the NBS, Gaithersburg, Maryland, October 3-7, 1966"

At head of title: United States Department of Commerce, National Bureau of Standards

Includes bibliographical references and index

Details

• NCID: BA28408736
• LCCN: 66062907
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: [Washington]
• Pages/Volumes: xviii, 580 p.
• Size: 26 cm
• Classification:
  • LCC : QC100
  • DC : 543
• Subject Headings:
  • LCSH : Chemistry, Analytic -- Congresses
• Parent Bibliography ID:
  • BA0484518X