Trace characterization : chemical and physical

著者

• Materials Research Symposium
• Meinke, W. Wayne
• Scribner, Bourdon F. (Bourdon Francis)
• Institute for Materials Research (U.S.)

書誌事項

Trace characterization : chemical and physical

W. Wayne Meinke and Bourdon F. Scribner, editors

（National Bureau of Standards monograph, 100）

Dept. of Commerce, National Bureau of Standards ; for sale by the Supt. of Docs., U.S. G.P.O., 1967

注記

"Based on lectures and discussions of the 1st Materials Research Symposium held at the NBS, Gaithersburg, Maryland, October 3-7, 1966"

At head of title: United States Department of Commerce, National Bureau of Standards

Includes bibliographical references and index

詳細情報

• NII書誌ID(NCID): BA28408736
• LCCN: 66062907
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: [Washington]
• ページ数/冊数: xviii, 580 p.
• 大きさ: 26 cm
• 分類:
  • LCC : QC100
  • DC : 543
• 件名:
  • LCSH : Chemistry, Analytic -- Congresses
• 親書誌ID:
  • BA0484518X